用干涉式噪声测量系统测量移相器的闪烁噪声

F. Yang, J.Y. Zhang, J.H. Qie, J. Ma
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引用次数: 0

摘要

采用一种新的双源扫频方法,建立了干涉式闪烁噪声测量系统,并对系统进行了标定。该测量系统的本底噪声为-172 dBrad2/Hz,足以测量具有超低闪烁噪声的两个端口微波元件。并首次对几种典型的超低闪烁噪声微波移相器进行了测量和比较。它的目的是表征微波移相器的噪声性能,这对相控阵和多通道应用的实际构造或硬件在环仿真至关重要。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Flicker Noise Measurement of Phase Shifters Using Interferometric Noise Measurement System
The interferometric flicker noise measurement system was set up and calibrated by using a novel two source frequency sweeping method. This measurement system features a noise floor of -172 dBrad2/Hz which is sufficient to measure two port microwave components with super low flicker noise. Also some typical microwave phase shifters with super low flicker noise were measured and compared for the first time. It aims to charac-tering the noise performance of the microwave phase shifters which are critical to the real construction or hardware-in-loop simulation of phased array and multi-channel applications.
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