2-GS/s 6位闪光ADC,带偏移校准

Ying-Zu Lin, Cheng-Wu Lin, Soon-Jyh Chang
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引用次数: 12

摘要

采用0.13 μ m CMOS工艺制作了一种具有数字失调校准方案的6位闪存模数转换器(ADC)。调整前置放大器的可编程加载装置可提高所设计ADC的线性度。为了降低功耗,所使用的电流型触发器根据采样率改变其工作模式。由逆变器和二极管连接的晶体管组成的简单检测器检测时钟速率。该ADC在高速模式下从1.2 v电源消耗170 mW。当输入频率较低时,该ADC的最大运算速度可达3.4 GS/s。在2gs /s工作时,其ENOB为5.11 bit, ERBW为650 MHz。所提出的ADC在2 GS/s的速度下实现了3.79 pJ/转换步长的FOM。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A 2-GS/s 6-bit flash ADC with offset calibration
A 6-bit flash analog-to-digital converter (ADC) with a digital offset calibration scheme is fabricated in a 0.13-mum CMOS process. Adjusting the programmable loading devices of the preamplifiers enhances the linearity of the proposed ADC. To reduce power consumption, the utilized current-mode flip-flops change their operation mode depending on the sampling rate. A simple detector composed of an inverter and a diode-connected transistor senses the clock rate. This ADC consumes 170 mW from a 1.2-V supply in high-speed mode. The maximum operation speed of this ADC achieves 3.4 GS/s when the input frequency is low. When operating at 2 GS/s, its ENOB is 5.11 bit and ERBW is 650 MHz. The proposed ADC achieves an FOM of 3.79 pJ/conversion-step at 2 GS/s.
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