光纤布拉格光栅光谱的波长与相位掩模周期相对应的特征出现

S. Yam, Z. Brodzeli, S. Wade, G. Baxter, S. Collins
{"title":"光纤布拉格光栅光谱的波长与相位掩模周期相对应的特征出现","authors":"S. Yam, Z. Brodzeli, S. Wade, G. Baxter, S. Collins","doi":"10.1109/APOS.2008.5226316","DOIUrl":null,"url":null,"abstract":"Use of a phase mask with 536 nm uniform pitch allowed the fabrication of a fiber Bragg grating for use at a Bragg wavelength of 785 nm. Reflection and transmission features at 1552 nm, i.e. twice the Bragg wavelength, associated with the phase mask periodicity were observed. However, when phase mask orders other than plusmn1 were absent during fabrication the features at 1552 nm were not evident.","PeriodicalId":154236,"journal":{"name":"2008 1st Asia-Pacific Optical Fiber Sensors Conference","volume":"346 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Occurrence of features of fiber Bragg grating spectra having a wavelength corresponding to the phase mask periodicity\",\"authors\":\"S. Yam, Z. Brodzeli, S. Wade, G. Baxter, S. Collins\",\"doi\":\"10.1109/APOS.2008.5226316\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Use of a phase mask with 536 nm uniform pitch allowed the fabrication of a fiber Bragg grating for use at a Bragg wavelength of 785 nm. Reflection and transmission features at 1552 nm, i.e. twice the Bragg wavelength, associated with the phase mask periodicity were observed. However, when phase mask orders other than plusmn1 were absent during fabrication the features at 1552 nm were not evident.\",\"PeriodicalId\":154236,\"journal\":{\"name\":\"2008 1st Asia-Pacific Optical Fiber Sensors Conference\",\"volume\":\"346 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 1st Asia-Pacific Optical Fiber Sensors Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APOS.2008.5226316\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 1st Asia-Pacific Optical Fiber Sensors Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APOS.2008.5226316","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9

摘要

使用536nm均匀间距的相位掩模,可以制作用于785nm布拉格波长的光纤布拉格光栅。在1552 nm处,即两倍布拉格波长处,观察到与相位掩模周期性相关的反射和透射特性。然而,当在制造过程中缺少plusmn1以外的相位掩模阶数时,1552 nm处的特征不明显。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Occurrence of features of fiber Bragg grating spectra having a wavelength corresponding to the phase mask periodicity
Use of a phase mask with 536 nm uniform pitch allowed the fabrication of a fiber Bragg grating for use at a Bragg wavelength of 785 nm. Reflection and transmission features at 1552 nm, i.e. twice the Bragg wavelength, associated with the phase mask periodicity were observed. However, when phase mask orders other than plusmn1 were absent during fabrication the features at 1552 nm were not evident.
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