残差BDD及其在算术电路验证中的应用

S. Kimura
{"title":"残差BDD及其在算术电路验证中的应用","authors":"S. Kimura","doi":"10.1145/217474.217584","DOIUrl":null,"url":null,"abstract":"The paper describes a verification method for arithmetic circuits based on residue arithmetic. In the verification, a residue module is attached to the specification and the implementation, and these outputs are compared by constructing BDD's. For the BDD construction without node explosion, we introduce a residue BDD whose width is less than or equal to a modulus. The method is useful for multipliers including C6288.","PeriodicalId":422297,"journal":{"name":"32nd Design Automation Conference","volume":"10556 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"23","resultStr":"{\"title\":\"Residue BDD and Its Application to the Verification of Arithmetic Circuits\",\"authors\":\"S. Kimura\",\"doi\":\"10.1145/217474.217584\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper describes a verification method for arithmetic circuits based on residue arithmetic. In the verification, a residue module is attached to the specification and the implementation, and these outputs are compared by constructing BDD's. For the BDD construction without node explosion, we introduce a residue BDD whose width is less than or equal to a modulus. The method is useful for multipliers including C6288.\",\"PeriodicalId\":422297,\"journal\":{\"name\":\"32nd Design Automation Conference\",\"volume\":\"10556 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"23\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"32nd Design Automation Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/217474.217584\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"32nd Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/217474.217584","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 23

摘要

本文提出了一种基于残数算法的算术电路验证方法。在验证过程中,对规范和实现附加一个剩余模块,并通过构造BDD来比较这些输出。对于无节点爆炸的BDD构造,我们引入了宽度小于或等于模数的残差BDD。该方法适用于包括C6288在内的乘法器。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Residue BDD and Its Application to the Verification of Arithmetic Circuits
The paper describes a verification method for arithmetic circuits based on residue arithmetic. In the verification, a residue module is attached to the specification and the implementation, and these outputs are compared by constructing BDD's. For the BDD construction without node explosion, we introduce a residue BDD whose width is less than or equal to a modulus. The method is useful for multipliers including C6288.
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