矩形单事件暂态故障模型中的脉冲长度确定技术

Alireza Rohani, H. Kerkhoff, Enrico Costenaro, D. Alexandrescu
{"title":"矩形单事件暂态故障模型中的脉冲长度确定技术","authors":"Alireza Rohani, H. Kerkhoff, Enrico Costenaro, D. Alexandrescu","doi":"10.1109/SAMOS.2013.6621125","DOIUrl":null,"url":null,"abstract":"One of the well-known models to represent Single Event Transient phenomenon at the logic-level is the rectangular pulse model. However, the pulse-length in this model has a vital contribution to the accuracy and validity of the rectangular pulse model. The work presented in this paper develops two approaches for determination of the pulse-length of the rectangular pulse model used in Single Event Transient (SET) faults. The first determination approach has been extracted from radiation testing along with transistor-level SET analysis tools. The second determination approach has been elicited from asymptotic analytical behaviour of SETs in 45-nm CMOS process. The results show that applying these two pulse-length determination approaches to the rectangular pulse model will cause the fault injection results converge much faster (up to sixteen times), compared to other conventional approaches.","PeriodicalId":382307,"journal":{"name":"2013 International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation (SAMOS)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-07-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Pulse-length determination techniques in the rectangular single event transient fault model\",\"authors\":\"Alireza Rohani, H. Kerkhoff, Enrico Costenaro, D. Alexandrescu\",\"doi\":\"10.1109/SAMOS.2013.6621125\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"One of the well-known models to represent Single Event Transient phenomenon at the logic-level is the rectangular pulse model. However, the pulse-length in this model has a vital contribution to the accuracy and validity of the rectangular pulse model. The work presented in this paper develops two approaches for determination of the pulse-length of the rectangular pulse model used in Single Event Transient (SET) faults. The first determination approach has been extracted from radiation testing along with transistor-level SET analysis tools. The second determination approach has been elicited from asymptotic analytical behaviour of SETs in 45-nm CMOS process. The results show that applying these two pulse-length determination approaches to the rectangular pulse model will cause the fault injection results converge much faster (up to sixteen times), compared to other conventional approaches.\",\"PeriodicalId\":382307,\"journal\":{\"name\":\"2013 International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation (SAMOS)\",\"volume\":\"42 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-07-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation (SAMOS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SAMOS.2013.6621125\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation (SAMOS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SAMOS.2013.6621125","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

矩形脉冲模型是在逻辑水平上描述单事件瞬态现象的著名模型之一。然而,该模型中的脉冲长度对矩形脉冲模型的准确性和有效性起着至关重要的作用。本文提出了两种方法来确定用于单事件暂态(SET)故障的矩形脉冲模型的脉冲长度。第一种测定方法是从辐射测试和晶体管级SET分析工具中提取出来的。第二种确定方法是从45纳米CMOS工艺中SETs的渐近分析行为中得出的。结果表明,将这两种脉冲长度确定方法应用于矩形脉冲模型,与其他常规方法相比,断层注入结果收敛速度更快(可达16倍)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Pulse-length determination techniques in the rectangular single event transient fault model
One of the well-known models to represent Single Event Transient phenomenon at the logic-level is the rectangular pulse model. However, the pulse-length in this model has a vital contribution to the accuracy and validity of the rectangular pulse model. The work presented in this paper develops two approaches for determination of the pulse-length of the rectangular pulse model used in Single Event Transient (SET) faults. The first determination approach has been extracted from radiation testing along with transistor-level SET analysis tools. The second determination approach has been elicited from asymptotic analytical behaviour of SETs in 45-nm CMOS process. The results show that applying these two pulse-length determination approaches to the rectangular pulse model will cause the fault injection results converge much faster (up to sixteen times), compared to other conventional approaches.
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