Alireza Rohani, H. Kerkhoff, Enrico Costenaro, D. Alexandrescu
{"title":"矩形单事件暂态故障模型中的脉冲长度确定技术","authors":"Alireza Rohani, H. Kerkhoff, Enrico Costenaro, D. Alexandrescu","doi":"10.1109/SAMOS.2013.6621125","DOIUrl":null,"url":null,"abstract":"One of the well-known models to represent Single Event Transient phenomenon at the logic-level is the rectangular pulse model. However, the pulse-length in this model has a vital contribution to the accuracy and validity of the rectangular pulse model. The work presented in this paper develops two approaches for determination of the pulse-length of the rectangular pulse model used in Single Event Transient (SET) faults. The first determination approach has been extracted from radiation testing along with transistor-level SET analysis tools. The second determination approach has been elicited from asymptotic analytical behaviour of SETs in 45-nm CMOS process. The results show that applying these two pulse-length determination approaches to the rectangular pulse model will cause the fault injection results converge much faster (up to sixteen times), compared to other conventional approaches.","PeriodicalId":382307,"journal":{"name":"2013 International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation (SAMOS)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-07-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Pulse-length determination techniques in the rectangular single event transient fault model\",\"authors\":\"Alireza Rohani, H. Kerkhoff, Enrico Costenaro, D. Alexandrescu\",\"doi\":\"10.1109/SAMOS.2013.6621125\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"One of the well-known models to represent Single Event Transient phenomenon at the logic-level is the rectangular pulse model. However, the pulse-length in this model has a vital contribution to the accuracy and validity of the rectangular pulse model. The work presented in this paper develops two approaches for determination of the pulse-length of the rectangular pulse model used in Single Event Transient (SET) faults. The first determination approach has been extracted from radiation testing along with transistor-level SET analysis tools. The second determination approach has been elicited from asymptotic analytical behaviour of SETs in 45-nm CMOS process. The results show that applying these two pulse-length determination approaches to the rectangular pulse model will cause the fault injection results converge much faster (up to sixteen times), compared to other conventional approaches.\",\"PeriodicalId\":382307,\"journal\":{\"name\":\"2013 International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation (SAMOS)\",\"volume\":\"42 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-07-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation (SAMOS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SAMOS.2013.6621125\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation (SAMOS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SAMOS.2013.6621125","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Pulse-length determination techniques in the rectangular single event transient fault model
One of the well-known models to represent Single Event Transient phenomenon at the logic-level is the rectangular pulse model. However, the pulse-length in this model has a vital contribution to the accuracy and validity of the rectangular pulse model. The work presented in this paper develops two approaches for determination of the pulse-length of the rectangular pulse model used in Single Event Transient (SET) faults. The first determination approach has been extracted from radiation testing along with transistor-level SET analysis tools. The second determination approach has been elicited from asymptotic analytical behaviour of SETs in 45-nm CMOS process. The results show that applying these two pulse-length determination approaches to the rectangular pulse model will cause the fault injection results converge much faster (up to sixteen times), compared to other conventional approaches.