宽光谱即插即用菲索干涉测量系统

Qi Lu, Xu Zhang, Yunbo Bai, Ying Sun, Shijie Liu, J. Shao
{"title":"宽光谱即插即用菲索干涉测量系统","authors":"Qi Lu, Xu Zhang, Yunbo Bai, Ying Sun, Shijie Liu, J. Shao","doi":"10.1117/12.2603720","DOIUrl":null,"url":null,"abstract":"In this paper, we present a wide-spectrum plug-and-play Fizeau interferometric system, which can complete precision interferometric measurement at any wavelength in the range of 600-1600 nm with a maximum measurement aperture of 150 mm. The system can be designed with multiple optical fiber input terminals, different wavelengths share only one set of interferometric system, and no components need to be adjusted when switching the working wavelength. The development of the system is helpful to accurately measure the surface profile error of coated optical elements at a specified wavelength.","PeriodicalId":298149,"journal":{"name":"Optical Metrology and Inspection for Industrial Applications VIII","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A wide-spectrum plug-and-play Fizeau interferometric system\",\"authors\":\"Qi Lu, Xu Zhang, Yunbo Bai, Ying Sun, Shijie Liu, J. Shao\",\"doi\":\"10.1117/12.2603720\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we present a wide-spectrum plug-and-play Fizeau interferometric system, which can complete precision interferometric measurement at any wavelength in the range of 600-1600 nm with a maximum measurement aperture of 150 mm. The system can be designed with multiple optical fiber input terminals, different wavelengths share only one set of interferometric system, and no components need to be adjusted when switching the working wavelength. The development of the system is helpful to accurately measure the surface profile error of coated optical elements at a specified wavelength.\",\"PeriodicalId\":298149,\"journal\":{\"name\":\"Optical Metrology and Inspection for Industrial Applications VIII\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-10-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optical Metrology and Inspection for Industrial Applications VIII\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.2603720\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Metrology and Inspection for Industrial Applications VIII","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2603720","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文提出了一种宽光谱即插即用的菲索干涉测量系统,该系统可以在600- 1600nm范围内的任意波长完成精密干涉测量,最大测量孔径为150mm。系统可设计多个光纤输入端子,不同波长共用一套干涉系统,切换工作波长时无需调整器件。该系统的开发有助于在特定波长下精确测量涂层光学元件的表面轮廓误差。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A wide-spectrum plug-and-play Fizeau interferometric system
In this paper, we present a wide-spectrum plug-and-play Fizeau interferometric system, which can complete precision interferometric measurement at any wavelength in the range of 600-1600 nm with a maximum measurement aperture of 150 mm. The system can be designed with multiple optical fiber input terminals, different wavelengths share only one set of interferometric system, and no components need to be adjusted when switching the working wavelength. The development of the system is helpful to accurately measure the surface profile error of coated optical elements at a specified wavelength.
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