近似和闪烁噪声形成点

A. Matsaev
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引用次数: 0

摘要

本文涉及电子放大器中噪声波动或闪烁噪声的研究领域,并致力于闪烁噪声谱密度的大小和形状的精确定义。分析了闪烁噪声的1/f近似,指出了其在分析电子放大器噪声特性时的非构造性问题。为了消除这个问题,定义了包络的物理形成机制,即谱密度闪烁噪声的一种形式。通过对闪烁噪声形成位置的精确定义,详细阐述了闪烁噪声的物理特性。通过对闪烁噪声的物理解释,给出了放大器闪烁噪声在噪声特性平坦截面上的最大差值的精确定义。解释了闪烁噪声呈指数增长的机理和条件以及随之产生的最大幅度的指数欲望。给出了一个简单的物理近似来确定闪变噪声谱密度包络形式的形成过程。详细介绍了在放大电路外部电路参与下,晶体管内部结构中闪变噪声张力谱密度形成的物理认识。研究结果将帮助开发人员解决许多构建电子器件的问题,并在一个新的质量水平上优化其特性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Approximation and the point of flicker-noise formation
The article refers to the field of research of noise fluctuations or flicker noise in electronic amplifiers and is devoted to the exact definition of the magnitude and shape of the spectral density of flicker-noise. The 1/f approximation of flicker noise is analyzed and the problem of its non-constructiveness in analyzing the noise characteristics of electronic amplifiers is shown. To eliminate this problem, the mechanism of physical formation of the envelope, a form of spectral density flicker-noise is defined. The physics of flicker-noise is detailed by accurate definition of the place of its formation. An accurate definition of the maximum difference of the amplifier flickernoise on the flat section of noise characteristics is given, using an explanation of the physics of flicker noise. The mechanism and conditions of the exponential increase of flicker noise and its subsequent exponential desire for maximum magnitude are explained. A simple physical approximation is given to determine the processes of forming the envelope form of the spectral density of flickernoise. The physical understanding of the formation of spectral density of flicker-noise tension in the internal structure of the transistor with the participation of external circuits of the amplifier electrical circuit is detailed. The results of the study will help developers to solve many problems of building electronic devices and optimizing their characteristics at a qualitatively new level.
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