{"title":"可修冗余计算机的设计","authors":"R. Teoste","doi":"10.1109/TEC.1962.5219425","DOIUrl":null,"url":null,"abstract":"The design of a repairable redundant computer is discussed using the Von Neumann multiplexing scheme. The general considerations, as well as the reasons for selecting this type of redundancy, are given. A reliability model of the redundant equipment is presented with resulting curves for estimating the reliability improvement and the additional cost of the redundant equipment. The mean time between failures of a typical redundant computer is shown to be several orders of magnitude greater than that of the nonredundant version of the same computer.","PeriodicalId":177496,"journal":{"name":"IRE Trans. Electron. Comput.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1962-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Design of a Repairable Redundant Computer\",\"authors\":\"R. Teoste\",\"doi\":\"10.1109/TEC.1962.5219425\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The design of a repairable redundant computer is discussed using the Von Neumann multiplexing scheme. The general considerations, as well as the reasons for selecting this type of redundancy, are given. A reliability model of the redundant equipment is presented with resulting curves for estimating the reliability improvement and the additional cost of the redundant equipment. The mean time between failures of a typical redundant computer is shown to be several orders of magnitude greater than that of the nonredundant version of the same computer.\",\"PeriodicalId\":177496,\"journal\":{\"name\":\"IRE Trans. Electron. Comput.\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1962-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IRE Trans. Electron. Comput.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEC.1962.5219425\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IRE Trans. Electron. Comput.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEC.1962.5219425","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The design of a repairable redundant computer is discussed using the Von Neumann multiplexing scheme. The general considerations, as well as the reasons for selecting this type of redundancy, are given. A reliability model of the redundant equipment is presented with resulting curves for estimating the reliability improvement and the additional cost of the redundant equipment. The mean time between failures of a typical redundant computer is shown to be several orders of magnitude greater than that of the nonredundant version of the same computer.
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