{"title":"有源箝位谐振直流链路逆变器系统的损耗","authors":"M. Dehmlow, K. Heumann, R. Sommer","doi":"10.1109/PESC.1993.471975","DOIUrl":null,"url":null,"abstract":"A detailed investigation of losses in an active clamped resonant DC-link inverter system is presented. To measure the component stress, a one phase test circuit, in which the semiconductor devices are stressed in a way similar to that in real resonant inverter systems, is described. A detailed investigation of semiconductor losses and passive component losses depending on parameters of the resonant tank is given. For the measurements fast switching and low saturation IGBTs were used. A comparison of semiconductor losses in an active clamped resonant DC link inverter and in a hard switched PWM inverter is given.<<ETX>>","PeriodicalId":358822,"journal":{"name":"Proceedings of IEEE Power Electronics Specialist Conference - PESC '93","volume":"60 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Losses in active clamped resonant DC-link inverter systems\",\"authors\":\"M. Dehmlow, K. Heumann, R. Sommer\",\"doi\":\"10.1109/PESC.1993.471975\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A detailed investigation of losses in an active clamped resonant DC-link inverter system is presented. To measure the component stress, a one phase test circuit, in which the semiconductor devices are stressed in a way similar to that in real resonant inverter systems, is described. A detailed investigation of semiconductor losses and passive component losses depending on parameters of the resonant tank is given. For the measurements fast switching and low saturation IGBTs were used. A comparison of semiconductor losses in an active clamped resonant DC link inverter and in a hard switched PWM inverter is given.<<ETX>>\",\"PeriodicalId\":358822,\"journal\":{\"name\":\"Proceedings of IEEE Power Electronics Specialist Conference - PESC '93\",\"volume\":\"60 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-06-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of IEEE Power Electronics Specialist Conference - PESC '93\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PESC.1993.471975\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE Power Electronics Specialist Conference - PESC '93","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PESC.1993.471975","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Losses in active clamped resonant DC-link inverter systems
A detailed investigation of losses in an active clamped resonant DC-link inverter system is presented. To measure the component stress, a one phase test circuit, in which the semiconductor devices are stressed in a way similar to that in real resonant inverter systems, is described. A detailed investigation of semiconductor losses and passive component losses depending on parameters of the resonant tank is given. For the measurements fast switching and low saturation IGBTs were used. A comparison of semiconductor losses in an active clamped resonant DC link inverter and in a hard switched PWM inverter is given.<>
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