0.18 /spl mu/m高密度MRAM的研究

M. Motoyoshi, I. Yamamura, W. Ohtsuka, M. Shouji, H. Yamagishi, M. Nakamura, H. Yamada, K. Tai, T. Kikutani, T. Sagara, K. Moriyama, H. Mori, C. Fukamoto, M. Watanabe, R. Hachino, H. Kano, K. Bessho, H. Narisawa, M. Hosomi, N. Okazaki
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引用次数: 15

摘要

本文主要研究如何降低磁隧道结(MTJ)元件的开关色散,提高其0/1分离度,从而实现高密度MRAM。对各种尺寸和形状的MTJ进行了评价,得出在类椭圆形状图案中,纵横比大于2就足以再现可靠的开关特性。在读取特性方面,优化后的MTJ模式与工艺相结合,使高、低电阻状态之间的距离达到21.4 sigma。在进一步研究MTJ形状与开关分布之间的关系时,我们发现“土星”形的MTJ具有最佳的开关行为。并对切换模式MRAM进行了评价,验证了其在高速编程中的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A study for 0.18 /spl mu/m high-density MRAM
In this paper, we study to reduce the switching dispersion and improve 0/1 separation of Magnetic Tunnel Junction (MTJ) elements in order to realize high density MRAM. Various kinds of MTJ sizes and shapes have been evaluated and conclude that in ellipse like shape pattern aspect ratio more than 2 is enough for reproducing and reliable switching characteristics. As regards the reading characteristics, the combination of the optimized MTJ pattern and process makes 21.4 sigma separation between high and low resistance states. In further study of the relation between MTJ shapes and switching distribution, we found a "Saturn" shaped MTJ has best switching behavior. Also the toggle mode MRAM is evaluated and its effectiveness for high speed programming is confirmed.
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