自适应多处理系统中基于sram的低成本SEU监视器设计

Junchao Chen, M. Andjelković, A. Simevski, Yuanqing Li, Patryk Skoncej, M. Krstic
{"title":"自适应多处理系统中基于sram的低成本SEU监视器设计","authors":"Junchao Chen, M. Andjelković, A. Simevski, Yuanqing Li, Patryk Skoncej, M. Krstic","doi":"10.1109/DSD.2019.00080","DOIUrl":null,"url":null,"abstract":"Cosmic radiation phenomena such as Solar Particle Events cause high radiation flux lasting from hours to days, thus increasing the probability of Single-Event Upsets (SEUs) for several orders of magnitude. In space applications it is necessary, therefore, to monitor the SEU rate in order to ensure timely detection of high radiation levels and efficient protection of radiation-sensitive circuits. This work proposes an approach combining the SEU monitoring and data storage functions in the same on-chip Static Random Access Memory (SRAM) module, with negligible cost and overheads compared to traditional stand-alone SEU monitors. Furthermore, it also enables the detection of permanent faults in SRAM. The proposed monitor is intended to be further integrated into a highly dependable and self-adaptive multiprocessing platform in which it will drive the selection of the multiprocessor operating modes. Thus, a dynamic trade-off between reliability, performance and power consumption in real-time can be achieved.","PeriodicalId":217233,"journal":{"name":"2019 22nd Euromicro Conference on Digital System Design (DSD)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":"{\"title\":\"Design of SRAM-Based Low-Cost SEU Monitor for Self-Adaptive Multiprocessing Systems\",\"authors\":\"Junchao Chen, M. Andjelković, A. Simevski, Yuanqing Li, Patryk Skoncej, M. Krstic\",\"doi\":\"10.1109/DSD.2019.00080\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Cosmic radiation phenomena such as Solar Particle Events cause high radiation flux lasting from hours to days, thus increasing the probability of Single-Event Upsets (SEUs) for several orders of magnitude. In space applications it is necessary, therefore, to monitor the SEU rate in order to ensure timely detection of high radiation levels and efficient protection of radiation-sensitive circuits. This work proposes an approach combining the SEU monitoring and data storage functions in the same on-chip Static Random Access Memory (SRAM) module, with negligible cost and overheads compared to traditional stand-alone SEU monitors. Furthermore, it also enables the detection of permanent faults in SRAM. The proposed monitor is intended to be further integrated into a highly dependable and self-adaptive multiprocessing platform in which it will drive the selection of the multiprocessor operating modes. Thus, a dynamic trade-off between reliability, performance and power consumption in real-time can be achieved.\",\"PeriodicalId\":217233,\"journal\":{\"name\":\"2019 22nd Euromicro Conference on Digital System Design (DSD)\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"13\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 22nd Euromicro Conference on Digital System Design (DSD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DSD.2019.00080\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 22nd Euromicro Conference on Digital System Design (DSD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DSD.2019.00080","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 13

摘要

宇宙辐射现象,如太阳粒子事件,造成持续数小时至数天的高辐射通量,从而使单事件扰动(SEUs)的概率增加了几个数量级。因此,在空间应用中,有必要监测SEU率,以确保及时发现高辐射水平并有效保护辐射敏感电路。这项工作提出了一种将SEU监测和数据存储功能结合在同一个片上静态随机存取存储器(SRAM)模块中的方法,与传统的独立SEU监视器相比,其成本和开销可以忽略不计。此外,它还可以检测SRAM中的永久故障。所提出的监视器旨在进一步集成到一个高度可靠和自适应的多处理平台中,在该平台中,它将驱动多处理器操作模式的选择。因此,可以实时实现可靠性、性能和功耗之间的动态权衡。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Design of SRAM-Based Low-Cost SEU Monitor for Self-Adaptive Multiprocessing Systems
Cosmic radiation phenomena such as Solar Particle Events cause high radiation flux lasting from hours to days, thus increasing the probability of Single-Event Upsets (SEUs) for several orders of magnitude. In space applications it is necessary, therefore, to monitor the SEU rate in order to ensure timely detection of high radiation levels and efficient protection of radiation-sensitive circuits. This work proposes an approach combining the SEU monitoring and data storage functions in the same on-chip Static Random Access Memory (SRAM) module, with negligible cost and overheads compared to traditional stand-alone SEU monitors. Furthermore, it also enables the detection of permanent faults in SRAM. The proposed monitor is intended to be further integrated into a highly dependable and self-adaptive multiprocessing platform in which it will drive the selection of the multiprocessor operating modes. Thus, a dynamic trade-off between reliability, performance and power consumption in real-time can be achieved.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信