{"title":"溅射激光电离光谱法和二次离子质谱法分析银/金合金","authors":"G. Havrilla, M. Nicholas, S. Bryan, J. Pruett","doi":"10.1364/laca.1990.tub3","DOIUrl":null,"url":null,"abstract":"Quantitative surface analysis has been the goal of several research\n groups using ion beam sputtering followed by laser photoionization.\n Published work has demonstrated trace level detection limits using\n both resonance and non-resonance ionization schemes.(1-4)\n Quantification of surface layers by SIMS requires that the standards\n be matrix matched to the unknowns. The reason for this is that in\n SIMS, the ionization process is intimately tied to the sputtering\n process. Resonance ionization requires calibration standards, however\n since the sputtering and ionization steps are separated, calibrations\n can be obtained that cover a wide range of matrices. Non-resonance on\n the other hand can use internal ratios to the matrix elements to\n provide rapid survey analyses. This work compares resonance and\n nonresonance ionization methods with SIMS for a silver/gold alloy\n system.","PeriodicalId":252738,"journal":{"name":"Laser Applications to Chemical Analysis","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Analysis of Ag/Au Alloy by Sputter Initiated Laser Ionization Spectrometry and Secondary Ion Mass Spectrometry\",\"authors\":\"G. Havrilla, M. Nicholas, S. Bryan, J. Pruett\",\"doi\":\"10.1364/laca.1990.tub3\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Quantitative surface analysis has been the goal of several research\\n groups using ion beam sputtering followed by laser photoionization.\\n Published work has demonstrated trace level detection limits using\\n both resonance and non-resonance ionization schemes.(1-4)\\n Quantification of surface layers by SIMS requires that the standards\\n be matrix matched to the unknowns. The reason for this is that in\\n SIMS, the ionization process is intimately tied to the sputtering\\n process. Resonance ionization requires calibration standards, however\\n since the sputtering and ionization steps are separated, calibrations\\n can be obtained that cover a wide range of matrices. Non-resonance on\\n the other hand can use internal ratios to the matrix elements to\\n provide rapid survey analyses. This work compares resonance and\\n nonresonance ionization methods with SIMS for a silver/gold alloy\\n system.\",\"PeriodicalId\":252738,\"journal\":{\"name\":\"Laser Applications to Chemical Analysis\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Laser Applications to Chemical Analysis\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/laca.1990.tub3\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Laser Applications to Chemical Analysis","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/laca.1990.tub3","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Analysis of Ag/Au Alloy by Sputter Initiated Laser Ionization Spectrometry and Secondary Ion Mass Spectrometry
Quantitative surface analysis has been the goal of several research
groups using ion beam sputtering followed by laser photoionization.
Published work has demonstrated trace level detection limits using
both resonance and non-resonance ionization schemes.(1-4)
Quantification of surface layers by SIMS requires that the standards
be matrix matched to the unknowns. The reason for this is that in
SIMS, the ionization process is intimately tied to the sputtering
process. Resonance ionization requires calibration standards, however
since the sputtering and ionization steps are separated, calibrations
can be obtained that cover a wide range of matrices. Non-resonance on
the other hand can use internal ratios to the matrix elements to
provide rapid survey analyses. This work compares resonance and
nonresonance ionization methods with SIMS for a silver/gold alloy
system.