S. Lapeyre, Nicolas Valette, Marc Merandat, M. Flottes, A. Virazel, B. Rouzeyre
{"title":"用于安全设备测试的轻量级，即插即用和自主JTAG认证IP","authors":"S. Lapeyre, Nicolas Valette, Marc Merandat, M. Flottes, A. Virazel, B. Rouzeyre","doi":"10.1109/ETS54262.2022.9810364","DOIUrl":null,"url":null,"abstract":"As any other circuits, secure devices need to be tested to ensure their reliability. Nevertheless, test infrastructures, such as JTAG or scan chains, can maliciously be used to steal secret data stored or processed in secure devices. In this paper, we explore a lightweight solution to protect JTAG access based on a challenge-response authentication protocol. A JTAG-authentication dedicated IP is presented. Design alternatives for quick IP plug-and-play, security, area and test time optimization are presented and evaluated.","PeriodicalId":334931,"journal":{"name":"2022 IEEE European Test Symposium (ETS)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"A Lightweight, Plug-and-Play and Autonomous JTAG Authentication IP for Secure Device Testing\",\"authors\":\"S. Lapeyre, Nicolas Valette, Marc Merandat, M. Flottes, A. Virazel, B. Rouzeyre\",\"doi\":\"10.1109/ETS54262.2022.9810364\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"As any other circuits, secure devices need to be tested to ensure their reliability. Nevertheless, test infrastructures, such as JTAG or scan chains, can maliciously be used to steal secret data stored or processed in secure devices. In this paper, we explore a lightweight solution to protect JTAG access based on a challenge-response authentication protocol. A JTAG-authentication dedicated IP is presented. Design alternatives for quick IP plug-and-play, security, area and test time optimization are presented and evaluated.\",\"PeriodicalId\":334931,\"journal\":{\"name\":\"2022 IEEE European Test Symposium (ETS)\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-05-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE European Test Symposium (ETS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ETS54262.2022.9810364\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE European Test Symposium (ETS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETS54262.2022.9810364","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Lightweight, Plug-and-Play and Autonomous JTAG Authentication IP for Secure Device Testing
As any other circuits, secure devices need to be tested to ensure their reliability. Nevertheless, test infrastructures, such as JTAG or scan chains, can maliciously be used to steal secret data stored or processed in secure devices. In this paper, we explore a lightweight solution to protect JTAG access based on a challenge-response authentication protocol. A JTAG-authentication dedicated IP is presented. Design alternatives for quick IP plug-and-play, security, area and test time optimization are presented and evaluated.
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