{"title":"基于灵敏度分析的模拟电路硬故障诊断","authors":"Yunsheng Lu, R. Dandapani","doi":"10.1109/VTEST.1993.313320","DOIUrl":null,"url":null,"abstract":"Sensitivity analysis is used to diagnose hard faults in analog circuits. Necessary and sufficient conditions are given to determine the suitability of a given parameter for diagnosis. It is also shown that if a parameter is not suitable then a functional variation of the parameter may be used for diagnosis.<<ETX>>","PeriodicalId":283218,"journal":{"name":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","volume":"85 40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Hard faults diagnosis in analog circuits using sensitivity analysis\",\"authors\":\"Yunsheng Lu, R. Dandapani\",\"doi\":\"10.1109/VTEST.1993.313320\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Sensitivity analysis is used to diagnose hard faults in analog circuits. Necessary and sufficient conditions are given to determine the suitability of a given parameter for diagnosis. It is also shown that if a parameter is not suitable then a functional variation of the parameter may be used for diagnosis.<<ETX>>\",\"PeriodicalId\":283218,\"journal\":{\"name\":\"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium\",\"volume\":\"85 40 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-04-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTEST.1993.313320\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1993.313320","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Hard faults diagnosis in analog circuits using sensitivity analysis
Sensitivity analysis is used to diagnose hard faults in analog circuits. Necessary and sufficient conditions are given to determine the suitability of a given parameter for diagnosis. It is also shown that if a parameter is not suitable then a functional variation of the parameter may be used for diagnosis.<>