Shivakumar Chedurupalli, T. Vishwam, Raju K.C James
{"title":"用半模波纹衬底集成波导结构测量液体复介电常数","authors":"Shivakumar Chedurupalli, T. Vishwam, Raju K.C James","doi":"10.1109/ARFTG52954.2022.9844125","DOIUrl":null,"url":null,"abstract":"Complex permittivity measurement of medium loss liquids with low sample volume determined in the discrete microwave (6.50 <v/GHz <10) frequency region using partially filled half mode corrugated substrate integrated waveguide (PFHMCSIW) structures. The ANSYS high frequency structure simulator (HFSS) is used to simulate the test structure mechanism. The transmission as well as reflection parameters are considered to evaluate the complex permittivity of the samples. The obtained permittivity data values are compared with the Open-ended coaxial probe technique data. The merits and demerits of both measurement techniques are discussed.","PeriodicalId":266876,"journal":{"name":"2022 98th ARFTG Microwave Measurement Conference (ARFTG)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Complex Permittivity Measurement of Liquids Using Half Mode Corrugated Substrate Integrated Waveguide Structure\",\"authors\":\"Shivakumar Chedurupalli, T. Vishwam, Raju K.C James\",\"doi\":\"10.1109/ARFTG52954.2022.9844125\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Complex permittivity measurement of medium loss liquids with low sample volume determined in the discrete microwave (6.50 <v/GHz <10) frequency region using partially filled half mode corrugated substrate integrated waveguide (PFHMCSIW) structures. The ANSYS high frequency structure simulator (HFSS) is used to simulate the test structure mechanism. The transmission as well as reflection parameters are considered to evaluate the complex permittivity of the samples. The obtained permittivity data values are compared with the Open-ended coaxial probe technique data. The merits and demerits of both measurement techniques are discussed.\",\"PeriodicalId\":266876,\"journal\":{\"name\":\"2022 98th ARFTG Microwave Measurement Conference (ARFTG)\",\"volume\":\"24 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-01-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 98th ARFTG Microwave Measurement Conference (ARFTG)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG52954.2022.9844125\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 98th ARFTG Microwave Measurement Conference (ARFTG)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG52954.2022.9844125","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}