直接覆盖(DOW) Ag-In-Sb-Te相变光学记录介质的显微结构研究

2000 Optical Data Storage. Conference Digest (Cat. No.00TH8491) Pub Date : 2000-05-14 DOI:10.1117/12.399344

S.J. Price, A. Greer, C. Davies

{"title":"直接覆盖(DOW) Ag-In-Sb-Te相变光学记录介质的显微结构研究","authors":"S.J. Price, A. Greer, C. Davies","doi":"10.1117/12.399344","DOIUrl":null,"url":null,"abstract":"Transmission electron microscopy has been used successfully to investigate the evolution of microstructure and crystalline phase selection during repeated direct-overwriting of Ag-In-Sb-Te phase-change optical recording media. It has been shown that the mark shape is partly determined by the multipulse beam used in writing and crystallization of the edges of the molten area, due to the thermal influence of the following pulse.","PeriodicalId":215485,"journal":{"name":"2000 Optical Data Storage. Conference Digest (Cat. No.00TH8491)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Microstructural studies of direct-overwrite (DOW) Ag-In-Sb-Te phase-change optical recording media\",\"authors\":\"S.J. Price, A. Greer, C. Davies\",\"doi\":\"10.1117/12.399344\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Transmission electron microscopy has been used successfully to investigate the evolution of microstructure and crystalline phase selection during repeated direct-overwriting of Ag-In-Sb-Te phase-change optical recording media. It has been shown that the mark shape is partly determined by the multipulse beam used in writing and crystallization of the edges of the molten area, due to the thermal influence of the following pulse.\",\"PeriodicalId\":215485,\"journal\":{\"name\":\"2000 Optical Data Storage. Conference Digest (Cat. No.00TH8491)\",\"volume\":\"17 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-05-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2000 Optical Data Storage. Conference Digest (Cat. No.00TH8491)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.399344\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 Optical Data Storage. Conference Digest (Cat. No.00TH8491)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.399344","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

利用透射电子显微镜成功地研究了Ag-In-Sb-Te相变光学记录介质在重复直接覆盖过程中的微观结构演变和晶相选择。结果表明，由于后续脉冲的热影响，用于书写和熔融区边缘结晶的多脉冲光束部分地决定了标记形状。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Microstructural studies of direct-overwrite (DOW) Ag-In-Sb-Te phase-change optical recording media

Transmission electron microscopy has been used successfully to investigate the evolution of microstructure and crystalline phase selection during repeated direct-overwriting of Ag-In-Sb-Te phase-change optical recording media. It has been shown that the mark shape is partly determined by the multipulse beam used in writing and crystallization of the edges of the molten area, due to the thermal influence of the following pulse.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2000 Optical Data Storage. Conference Digest (Cat. No.00TH8491)

自引率

0.00%

发文量