{"title":"工业过程的曲线解释与诊断技术","authors":"S. Dolins, J. Reese","doi":"10.1109/AIES.1990.666343","DOIUrl":null,"url":null,"abstract":"Detecting manufacturing problems as soon as they occur is important for efficient manufacturing in today's factories. Many of these problems could be minimized by installing diagnostic systems to monitor manufacturing steps. A diagnostic technique has been developed to analyze process parameters and observables that change over time. Process parameters control the operation of equipment, and observables are attributes of a partially completed product. The technique uses a specified digital signal processing algorithm known as dynamic time warping (DTW) to transform the input signal into symbolic data. Knowledge-based diagnosis is performed on the symbolic data to determine malfunctions. A detailed description of the DTW algorithm and knowledge-based analysis is presented. Two different applications-one in the glass industry and another one in the semiconductor industry-are discussed to illustrate the general use of this technique. >","PeriodicalId":347147,"journal":{"name":"The First International Conference on Applications of Industrial Electronics Systems","volume":"69 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"15","resultStr":"{\"title\":\"A Curve Interpretation and Diagnostic Technique for Industrial Processes\",\"authors\":\"S. Dolins, J. Reese\",\"doi\":\"10.1109/AIES.1990.666343\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Detecting manufacturing problems as soon as they occur is important for efficient manufacturing in today's factories. Many of these problems could be minimized by installing diagnostic systems to monitor manufacturing steps. A diagnostic technique has been developed to analyze process parameters and observables that change over time. Process parameters control the operation of equipment, and observables are attributes of a partially completed product. The technique uses a specified digital signal processing algorithm known as dynamic time warping (DTW) to transform the input signal into symbolic data. Knowledge-based diagnosis is performed on the symbolic data to determine malfunctions. A detailed description of the DTW algorithm and knowledge-based analysis is presented. Two different applications-one in the glass industry and another one in the semiconductor industry-are discussed to illustrate the general use of this technique. >\",\"PeriodicalId\":347147,\"journal\":{\"name\":\"The First International Conference on Applications of Industrial Electronics Systems\",\"volume\":\"69 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-05-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"15\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"The First International Conference on Applications of Industrial Electronics Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AIES.1990.666343\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"The First International Conference on Applications of Industrial Electronics Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AIES.1990.666343","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Curve Interpretation and Diagnostic Technique for Industrial Processes
Detecting manufacturing problems as soon as they occur is important for efficient manufacturing in today's factories. Many of these problems could be minimized by installing diagnostic systems to monitor manufacturing steps. A diagnostic technique has been developed to analyze process parameters and observables that change over time. Process parameters control the operation of equipment, and observables are attributes of a partially completed product. The technique uses a specified digital signal processing algorithm known as dynamic time warping (DTW) to transform the input signal into symbolic data. Knowledge-based diagnosis is performed on the symbolic data to determine malfunctions. A detailed description of the DTW algorithm and knowledge-based analysis is presented. Two different applications-one in the glass industry and another one in the semiconductor industry-are discussed to illustrate the general use of this technique. >