嵌入式MCU内核验证中的复用问题

Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611) Pub Date : 2002-08-07 DOI:10.1109/ICCDCS.2002.1004000

Narcizo Sabbatini, Antonio Mauricio Brochi, Tulio Ibanez Nunes

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引用次数: 3

摘要

本文讨论了与微控制器(MCU)内嵌核验证相关的主要问题。讨论了验证环境设计、仿真模式策略和重用、单机级和芯片级验证等问题。从跨设计周期重用的角度对验证环境进行分析，重点关注核心独立设备和芯片级验证。包括案例研究分析。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Reuse issues on the verification of embedded MCU cores

The main issues related to the verification of cores embedded in a microcontroller unit (MCU) are addressed in this paper. Issues such as verification environment design, simulation pattern strategies and reuse, as well as standalone and chip level verification are discussed. An analysis of the verification environment is performed from the perspective of the reuse across the design cycle, focussing on the core standalone and on the chip level verification. A case study analysis is included.

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Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611)

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