{"title":"利用混合像素探测器了解半导体中带电粒子和中子撞击后的电离能损失","authors":"B. Bergmann","doi":"10.1109/AE54730.2022.9920076","DOIUrl":null,"url":null,"abstract":"Hybrid pixel detectors of Timepix3 technology allow noiseless single particle detection and identification. We exploit this capability for a comprehensive study of ionizing energy losses and their spatial distribution in silicon sensors after exposure to charged particles and neutrons. (Abstract)","PeriodicalId":113076,"journal":{"name":"2022 International Conference on Applied Electronics (AE)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-09-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Understanding ionizing energy losses after charged particle and neutron impact in semiconductors with hybrid pixel detectors\",\"authors\":\"B. Bergmann\",\"doi\":\"10.1109/AE54730.2022.9920076\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Hybrid pixel detectors of Timepix3 technology allow noiseless single particle detection and identification. We exploit this capability for a comprehensive study of ionizing energy losses and their spatial distribution in silicon sensors after exposure to charged particles and neutrons. (Abstract)\",\"PeriodicalId\":113076,\"journal\":{\"name\":\"2022 International Conference on Applied Electronics (AE)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-09-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 International Conference on Applied Electronics (AE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AE54730.2022.9920076\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 International Conference on Applied Electronics (AE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AE54730.2022.9920076","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Understanding ionizing energy losses after charged particle and neutron impact in semiconductors with hybrid pixel detectors
Hybrid pixel detectors of Timepix3 technology allow noiseless single particle detection and identification. We exploit this capability for a comprehensive study of ionizing energy losses and their spatial distribution in silicon sensors after exposure to charged particles and neutrons. (Abstract)
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