{"title":"在室温下连续工作的真空沉积薄膜干涉仪","authors":"S. F. Apanasevich, F. Karpushko, G. Sinitsyn","doi":"10.1364/obi.1983.fb4","DOIUrl":null,"url":null,"abstract":"Bistable operation of a nonlinear thin-film semiconductor interferometer, fabricated by vacuum deposition, was first observed in [1]. Refractive index nonlinearity required was achieved in a ZnS-spacer of submicron thickness with the input light beam intensity of about 6 kW/cm2.","PeriodicalId":114315,"journal":{"name":"Topical Meeting on Optical Bistability","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Vacuum-Deposited Thin-Film Interferometers as Bistable Devices Operating Continuously at Room Temperature\",\"authors\":\"S. F. Apanasevich, F. Karpushko, G. Sinitsyn\",\"doi\":\"10.1364/obi.1983.fb4\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Bistable operation of a nonlinear thin-film semiconductor interferometer, fabricated by vacuum deposition, was first observed in [1]. Refractive index nonlinearity required was achieved in a ZnS-spacer of submicron thickness with the input light beam intensity of about 6 kW/cm2.\",\"PeriodicalId\":114315,\"journal\":{\"name\":\"Topical Meeting on Optical Bistability\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Topical Meeting on Optical Bistability\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/obi.1983.fb4\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Topical Meeting on Optical Bistability","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/obi.1983.fb4","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Vacuum-Deposited Thin-Film Interferometers as Bistable Devices Operating Continuously at Room Temperature
Bistable operation of a nonlinear thin-film semiconductor interferometer, fabricated by vacuum deposition, was first observed in [1]. Refractive index nonlinearity required was achieved in a ZnS-spacer of submicron thickness with the input light beam intensity of about 6 kW/cm2.
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