基于仿真的测试和验证设计的功能、性能、功率和电源电压行为

N. Druml, M. Menghin, C. Steger, R. Weiss, Andreas Genser, H. Bock, J. Haid
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引用次数: 6

摘要

测试和验证是产品开发周期中必不可少的部分。仿真和仿真是众所周知的技术,用于测试和验证在测设计(DUT)的功能。然而,还有其他问题,如峰值功耗和电源电压下降,这可能会损害硬件的功能。目前的功能硬件仿真测试和验证方法只涵盖了这些问题的一部分。本文提出了一种综合仿真方法。它将功能硬件仿真与基于模型的性能、功率和电源电压分析技术相结合。DUT必须以硬件描述语言提供,与指定的分析单元一起集成到FPGA中。这些分析单元实现了被测设备的性能、功耗和供电电压行为的模型。所提出的仿真方法允许设计人员以这样一种方式测试设计,即在线实时获取周期准确结果,并验证功能和性能行为,以及功耗和电源电压水平。本文以综合仿真方法为应用实例,验证了LEON3多核处理器系统和射频供电非接触式智能卡的设计。所描述的结果表明,这种仿真方法适用于检测由电源和电源电压危险引起的功能异常行为以及它们如何影响系统的性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Emulation-Based Test and Verification of a Design's Functional, Performance, Power, and Supply Voltage Behavior
Test and verification are essential parts during a product's development cycle. Simulation and emulation are well known techniques to test and verify the functionality of a design-under-test (DUT) before its tape-out. However, there are additional issues like peak power consumption and supply voltage drops, which can compromise a hardware's functionality. These issues are only partly covered by nowadays functional hardware emulation test and verification approaches. This paper presents a comprehensive emulation methodology. It combines functional hardware emulation with model-based performance, power, and supply voltage analysis techniques. The DUT, which has to be available in a hardware description language, is integrated into a FPGA along with designated analysis units. These analysis units implement models of the DUT's performance, power consumption, and supply voltage behavior. The presented emulation methodology allows a designer to test designs in such a way that the cycle accurate results are taken online, in real-time, and verify both functional and performance behavior, as well as power consumption and supply voltage levels. The proposed comprehensive emulation methodology is used, as an example of application, to verify the design of a LEON3 multi-core processor system as well as a RF-powered contacatless smart card. The depicted results demonstrate that this emulation approach is suitable to detect functional misbehavior caused by power and supply voltage hazards and how they influence the performance of the system.
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