EVM-aware PDN Target Impedance for Integrated RF System

This paper provides supply-induced sensitivity methodology to solve RF integrated transmitter IP design challenge in co-design chip, package and system. Supply noise induced error vector magnitude (EVM) degradation is one of the major sources of SNR degradation in RFIC systems. In this paper, the methodology for RF front-end IP is developed using the frequency-dependent uncertainties transfer function and relationship between induced uncertainty and EVM degradation. The analysis results are also well correlated with constellation diagram which is a representation of a signal modulated by a digital modulation scheme designed in highly-integrated RF transceiver for WLAN applications. The proposed methodology provides uncertainty-aware frequency-dependent PDN target impedance modeling. The goal during is to provide adequate performance for cost-effective and system solution at early design stage and achieving on system-level success.