{"title":"利用精确的基极电阻模型提取双极晶体管的基极和发射极电阻","authors":"F. Ingvarson, M. Linder, K. Jeppson","doi":"10.1109/ICMTS.2002.1193174","DOIUrl":null,"url":null,"abstract":"A straightforward method for extracting the base and emitter resistances is presented. The method has the following properties: 1) only a standard forward Gummel measurement on one transistor is required, 2) current-crowding and conductivity-modulation in the base are accounted for through the use of an accurate base resistance model, and 3) the resistance parameters are extracted using a non-linear optimization step. Furthermore, a technique for extraction of the high-injection parameters of a modified collector current model is also presented.","PeriodicalId":188074,"journal":{"name":"Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002.","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-04-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Extraction of the base and emitter resistances in bipolar transistors using an accurate base resistance model\",\"authors\":\"F. Ingvarson, M. Linder, K. Jeppson\",\"doi\":\"10.1109/ICMTS.2002.1193174\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A straightforward method for extracting the base and emitter resistances is presented. The method has the following properties: 1) only a standard forward Gummel measurement on one transistor is required, 2) current-crowding and conductivity-modulation in the base are accounted for through the use of an accurate base resistance model, and 3) the resistance parameters are extracted using a non-linear optimization step. Furthermore, a technique for extraction of the high-injection parameters of a modified collector current model is also presented.\",\"PeriodicalId\":188074,\"journal\":{\"name\":\"Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002.\",\"volume\":\"22 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-04-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMTS.2002.1193174\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMTS.2002.1193174","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Extraction of the base and emitter resistances in bipolar transistors using an accurate base resistance model
A straightforward method for extracting the base and emitter resistances is presented. The method has the following properties: 1) only a standard forward Gummel measurement on one transistor is required, 2) current-crowding and conductivity-modulation in the base are accounted for through the use of an accurate base resistance model, and 3) the resistance parameters are extracted using a non-linear optimization step. Furthermore, a technique for extraction of the high-injection parameters of a modified collector current model is also presented.