SPICA:一种回顾和分析故障定位技术的方法

Xiao-Yi Zhang, Mingyue Jiang
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引用次数: 0

摘要

基于谱的故障定位(SBFL)是一种众所周知的查找程序中错误语句的技术。迄今为止,已经提出了各种旨在从不同方面改进SBFL的技术,并遵循各自的理论和假设。因此,对其合理性和实用性做出公正的评价是一项挑战。在本文中,我们提出了用于综合分析的光谱图解(SPICA),这是一种使用光谱可视化来审查和分析现有SBFL作品的方法。具体来说,SPICA将特定的SBFL技术(例如,怀疑度度量)作为输入,说明光谱空间中的相关伪像,然后按照1)检查几何特征(gc)和2)知识挖掘的步骤分析可视化光谱分布。这样,我们就可以对各种SBFL技术进行全面的回顾,并得到分析结果。作为例子,我们使用SPICA分析了五种具有代表性的SBFL技术,这些技术提供了基础理论或实验结果。最后,我们对每种技术的基本原理进行了全面评估,并附上了对未来验证和扩展有用的建议。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
SPICA: A Methodology for Reviewing and Analysing Fault Localisation Techniques
Spectrum-Based Fault Localisation (SBFL) is a well-known technique to find faulty statements in a program. To date, various techniques aiming to improve SBFL from different aspects have been proposed, following their own theories and assumptions. Therefore, it is challenging to make a fair assessment of their rationale and practicability. In this paper, we propose the SPectra Illustration for Comprehensive Analysis (SPICA), a methodology for reviewing and analysing existing SBFL works using spectrum visualisation. Specifically, taking as input a specific SBFL technique (e.g., a suspiciousness metric), SPICA illustrates the relevant artefacts within the spectrum space and then analyse the visualised spectra distribution following the steps of 1) examining the Geometric Characteristics (GCs) and 2) knowledge mining. In this way, we can do overall reviews for various SBFL techniques and get analysis results. As examples, we use SPICA to analyse five representative SBFL techniques, which provide fundamental theories or experimental results. Finally, we provide an overall assessment of the rationale for each technique, attached with suggestions that could be useful for future validation and extension.
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