{"title":"利用突变技术自动修正某些设计错误","authors":"Payman Behnam, B. Alizadeh, Z. Navabi","doi":"10.1109/ETS.2014.6847833","DOIUrl":null,"url":null,"abstract":"In this paper, we introduce a new technique that makes use of satisfiability (SAT) based debugging techniques along with a mutation-based technique to correct certain design errors in digital designs automatically. The experimental results demonstrate that our proposed method enables us to locate and correct multiple bugs by targeting gate replacements and wire exchanging within reasonable run-time and memory usage for several designs.","PeriodicalId":145416,"journal":{"name":"2014 19th IEEE European Test Symposium (ETS)","volume":"143 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"Automatic correction of certain design errors using mutation technique\",\"authors\":\"Payman Behnam, B. Alizadeh, Z. Navabi\",\"doi\":\"10.1109/ETS.2014.6847833\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we introduce a new technique that makes use of satisfiability (SAT) based debugging techniques along with a mutation-based technique to correct certain design errors in digital designs automatically. The experimental results demonstrate that our proposed method enables us to locate and correct multiple bugs by targeting gate replacements and wire exchanging within reasonable run-time and memory usage for several designs.\",\"PeriodicalId\":145416,\"journal\":{\"name\":\"2014 19th IEEE European Test Symposium (ETS)\",\"volume\":\"143 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-05-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 19th IEEE European Test Symposium (ETS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ETS.2014.6847833\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 19th IEEE European Test Symposium (ETS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETS.2014.6847833","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Automatic correction of certain design errors using mutation technique
In this paper, we introduce a new technique that makes use of satisfiability (SAT) based debugging techniques along with a mutation-based technique to correct certain design errors in digital designs automatically. The experimental results demonstrate that our proposed method enables us to locate and correct multiple bugs by targeting gate replacements and wire exchanging within reasonable run-time and memory usage for several designs.