T. Nunley, N. Fernando, J. Moya, N. S. Arachchige, C. Nelson, A. Medina, S. Zollner
{"title":"Ge和GeO2的精确光学常数为0.5 ~ 6.6 eV","authors":"T. Nunley, N. Fernando, J. Moya, N. S. Arachchige, C. Nelson, A. Medina, S. Zollner","doi":"10.1109/PHOSST.2016.7548738","DOIUrl":null,"url":null,"abstract":"Germanium-based photonics or photovoltaics applications require precise knowledge of the optical constants (refractive index, absorption coefficient, dielectric function) for Ge and GeO2 over a broad spectral range. Unfortunately, we don't know as much about these as for Si and SiO2. We therefore apply the same technique to Ge (spectroscopic ellipsometry with multi-sample analysis), which was used to determine the so-called “Woollam Silicon” optical constants.","PeriodicalId":337671,"journal":{"name":"2016 IEEE Photonics Society Summer Topical Meeting Series (SUM)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Precise optical constants of Ge and GeO2 from 0.5 to 6.6 eV\",\"authors\":\"T. Nunley, N. Fernando, J. Moya, N. S. Arachchige, C. Nelson, A. Medina, S. Zollner\",\"doi\":\"10.1109/PHOSST.2016.7548738\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Germanium-based photonics or photovoltaics applications require precise knowledge of the optical constants (refractive index, absorption coefficient, dielectric function) for Ge and GeO2 over a broad spectral range. Unfortunately, we don't know as much about these as for Si and SiO2. We therefore apply the same technique to Ge (spectroscopic ellipsometry with multi-sample analysis), which was used to determine the so-called “Woollam Silicon” optical constants.\",\"PeriodicalId\":337671,\"journal\":{\"name\":\"2016 IEEE Photonics Society Summer Topical Meeting Series (SUM)\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-07-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE Photonics Society Summer Topical Meeting Series (SUM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PHOSST.2016.7548738\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE Photonics Society Summer Topical Meeting Series (SUM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PHOSST.2016.7548738","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Precise optical constants of Ge and GeO2 from 0.5 to 6.6 eV
Germanium-based photonics or photovoltaics applications require precise knowledge of the optical constants (refractive index, absorption coefficient, dielectric function) for Ge and GeO2 over a broad spectral range. Unfortunately, we don't know as much about these as for Si and SiO2. We therefore apply the same technique to Ge (spectroscopic ellipsometry with multi-sample analysis), which was used to determine the so-called “Woollam Silicon” optical constants.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
