{"title":"改进了高电流密度下先进双极晶体管传输时间和多余相位延迟的建模","authors":"Seonghearn Lee","doi":"10.1109/MWSCAS.2001.986319","DOIUrl":null,"url":null,"abstract":"Bias-dependent data of the forward transit time and excess phase delay at high current densities are extracted using an accurate measurement technique based on Z-parameter equations. Using these data, simple expressions of these parameters have been developed to improve a RF large-signal bipolar transistor model, and their accuracy is verified by showing good agreements with measured data.","PeriodicalId":403026,"journal":{"name":"Proceedings of the 44th IEEE 2001 Midwest Symposium on Circuits and Systems. MWSCAS 2001 (Cat. No.01CH37257)","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-08-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Improved modeling for transit time and excess phase delay of advanced bipolar transistors at high current densities\",\"authors\":\"Seonghearn Lee\",\"doi\":\"10.1109/MWSCAS.2001.986319\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Bias-dependent data of the forward transit time and excess phase delay at high current densities are extracted using an accurate measurement technique based on Z-parameter equations. Using these data, simple expressions of these parameters have been developed to improve a RF large-signal bipolar transistor model, and their accuracy is verified by showing good agreements with measured data.\",\"PeriodicalId\":403026,\"journal\":{\"name\":\"Proceedings of the 44th IEEE 2001 Midwest Symposium on Circuits and Systems. MWSCAS 2001 (Cat. No.01CH37257)\",\"volume\":\"36 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-08-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 44th IEEE 2001 Midwest Symposium on Circuits and Systems. MWSCAS 2001 (Cat. No.01CH37257)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSCAS.2001.986319\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 44th IEEE 2001 Midwest Symposium on Circuits and Systems. MWSCAS 2001 (Cat. No.01CH37257)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSCAS.2001.986319","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Improved modeling for transit time and excess phase delay of advanced bipolar transistors at high current densities
Bias-dependent data of the forward transit time and excess phase delay at high current densities are extracted using an accurate measurement technique based on Z-parameter equations. Using these data, simple expressions of these parameters have been developed to improve a RF large-signal bipolar transistor model, and their accuracy is verified by showing good agreements with measured data.