低模光纤的有效模场直径测量

T. Matsui, T. Sakamoto, K. Nakajima
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引用次数: 2

摘要

实验研究了传统的近场模式(NFP)、远场模式(FFP)和变孔径(VA)方法测量高阶模式的有效模场直径(MFD)的适用性,该方法可用于准确评估拼接损耗。通过分别考虑最小扫描角和最小数值孔径(NA),我们证实了FFP和VA方法得到的MFD值的变化可以收敛于基阶和高阶模式。我们发现FFP和VA方法在FMF中提供了足够的有效MFD值,可以用于评估基于传统高斯拟合模型的剪接损失。我们还发现,VA方法中的最小NA可以作为有效MFD的函数来确定。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Effective mode-field diameter measurement for few-mode fibers
We experimentally investigate the applicability of the conventional near-field patter (NFP), far-field pattern (FFP) and variable aperture (VA) methods for measuring the effective mode-field diameter (MFD) of the higher-order mode which can be used for evaluating the splice loss accurately. We confirmed that the variation in measured MFD values obtained with FFP and VA methods can be converged by considering the minimum scanning angle and minimum numerical aperture (NA) respectively for both fundamental and higher-order modes. We reveal that the FFP and VA methods provide adequate effective MFD values in the FMF, which can be used for evaluating the splice loss based on the traditional Gaussian fitting model. We also found that the minimum NA in the VA method can be determined empirically as a function of the effective MFD.
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