纳米器件输入阻抗匹配的解决方案:在y支路结高频直流整流器上的应用

2006 European Microwave Integrated Circuits Conference Pub Date : 2006-09-01 DOI:10.1109/EMICC.2006.282735

L. Bednarz, Rashmi, G. Farhi, B. Hackens, V. Bayot, I. Huynen

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引用次数: 2

摘要

以y支路结为例，分析了纳米器件的高输入阻抗问题。利用经实测数据验证的YBJ电非线性模型，分析了源阻抗对YBJ高频到直流检测性能的影响。提出了一种阻抗匹配网络，并证明该网络能提高检测灵敏度。多2DEG通道材料用于制造相互堆叠的平行YBJ也被提出作为不匹配问题的替代解决方案。结果表明，使用多个2DEG可以降低输入阻抗和反射系数，但代价是灵敏度降低

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Solutions for input impedance matching of nanodevices: Application to Y-Branch Junction HF to DC rectifier

The problem of high input impedance of nanoscaled devices is analyzed for the case of a Y-Branch Junction. An electrical nonlinear model of YBJs validated on measured data is used to show influence of source impedance on HF to DC detection performance in YBJ. An impedance matching network is proposed and is proven to increase the detection sensitivity. Multiple 2DEG channels material used to fabricate parallel YBJ's stacked on one another is also proposed as an alternative solution to mismatch problem. It is shown that using multiple 2DEG the input impedance and reflection coefficient can be decreased but at the price of decrease in sensitivity

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2006 European Microwave Integrated Circuits Conference

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