NAND闪存测试:对实际缺陷的初步研究

2009 International Test Conference Pub Date : 2009-12-18 DOI:10.1109/TEST.2009.5355898

Pierre-Didier Mauroux, A. Virazel, A. Bosio, L. Dilillo, P. Girard, S. Pravossoudovitch, B. Godard

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引用次数: 7

摘要

嵌入式闪存以NOR架构为主，但NAND因其高存储容量而被越来越多地采用。本文对NAND阵列的实际缺陷进行了初步研究。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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NAND flash testing: A preliminary study on actual defects

Embedded flash memories are dominated by the NOR architecture but NAND is becoming more and more adopted due to its high storage capacity. This paper presents a preliminary study on actual defects in NAND array.

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2009 International Test Conference

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