从软件缺陷存储库中挖掘用于黑盒测试的频繁模式

Ning Li, Zhanhuai Li, Lijun Zhang
{"title":"从软件缺陷存储库中挖掘用于黑盒测试的频繁模式","authors":"Ning Li, Zhanhuai Li, Lijun Zhang","doi":"10.1109/IWISA.2010.5473578","DOIUrl":null,"url":null,"abstract":"Software defects are usually detected by inspection,black-box testing or white-box testing. Current software defect mining work focuses on mining frequent patterns without distinguishing these different kinds of defects, and mining with respect to defect type can only give limited guidance on software development due to overly broad classification of defect type. In this paper, we present four kinds of frequent patterns from defects detected by black-box testing (called black-box defect) based on a kind of detailed classification named ODC-BD (Orthogonal Defect Classification for Blackbox Defect). The frequent patterns include the top 10 conditions (data or operation) which most easily result in defects or severe defects, the top 10 defect phenomena which most frequently occur and have a great impact on users, association rules between function modules and defect types. We aim to help project managers, black-box testers and developers improve the efficiency of software defect detection and analysis using these frequent patterns. Our study is based on 5023 defect reports from 56 large industrial projects and 2 open source projects.","PeriodicalId":298764,"journal":{"name":"2010 2nd International Workshop on Intelligent Systems and Applications","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Mining Frequent Patterns from Software Defect Repositories for Black-Box Testing\",\"authors\":\"Ning Li, Zhanhuai Li, Lijun Zhang\",\"doi\":\"10.1109/IWISA.2010.5473578\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Software defects are usually detected by inspection,black-box testing or white-box testing. Current software defect mining work focuses on mining frequent patterns without distinguishing these different kinds of defects, and mining with respect to defect type can only give limited guidance on software development due to overly broad classification of defect type. In this paper, we present four kinds of frequent patterns from defects detected by black-box testing (called black-box defect) based on a kind of detailed classification named ODC-BD (Orthogonal Defect Classification for Blackbox Defect). The frequent patterns include the top 10 conditions (data or operation) which most easily result in defects or severe defects, the top 10 defect phenomena which most frequently occur and have a great impact on users, association rules between function modules and defect types. We aim to help project managers, black-box testers and developers improve the efficiency of software defect detection and analysis using these frequent patterns. Our study is based on 5023 defect reports from 56 large industrial projects and 2 open source projects.\",\"PeriodicalId\":298764,\"journal\":{\"name\":\"2010 2nd International Workshop on Intelligent Systems and Applications\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-05-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 2nd International Workshop on Intelligent Systems and Applications\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IWISA.2010.5473578\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 2nd International Workshop on Intelligent Systems and Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IWISA.2010.5473578","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9

摘要

软件缺陷通常通过检查、黑盒测试或白盒测试来检测。当前的软件缺陷挖掘工作关注于挖掘频繁的模式,而没有区分这些不同类型的缺陷,并且由于缺陷类型的分类过于宽泛,关于缺陷类型的挖掘只能对软件开发提供有限的指导。本文基于一种名为ODC-BD (Orthogonal defect classification for Blackbox defect)的详细分类方法,给出了黑盒测试中检测到的缺陷(称为黑盒缺陷)的四种常见模式。频繁模式包括最容易导致缺陷或严重缺陷的前10个条件(数据或操作)、最频繁发生且对用户影响最大的前10个缺陷现象、功能模块之间的关联规则和缺陷类型。我们的目标是帮助项目经理、黑盒测试人员和开发人员使用这些频繁的模式来提高软件缺陷检测和分析的效率。我们的研究是基于来自56个大型工业项目和2个开源项目的5023个缺陷报告。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Mining Frequent Patterns from Software Defect Repositories for Black-Box Testing
Software defects are usually detected by inspection,black-box testing or white-box testing. Current software defect mining work focuses on mining frequent patterns without distinguishing these different kinds of defects, and mining with respect to defect type can only give limited guidance on software development due to overly broad classification of defect type. In this paper, we present four kinds of frequent patterns from defects detected by black-box testing (called black-box defect) based on a kind of detailed classification named ODC-BD (Orthogonal Defect Classification for Blackbox Defect). The frequent patterns include the top 10 conditions (data or operation) which most easily result in defects or severe defects, the top 10 defect phenomena which most frequently occur and have a great impact on users, association rules between function modules and defect types. We aim to help project managers, black-box testers and developers improve the efficiency of software defect detection and analysis using these frequent patterns. Our study is based on 5023 defect reports from 56 large industrial projects and 2 open source projects.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信