{"title":"用于高引脚数集成电路的通用高速测试夹具","authors":"P. S. Levy","doi":"10.1109/SOUTHC.1994.498152","DOIUrl":null,"url":null,"abstract":"This paper details design guidelines and implementation of a universal load-board system to support high-pin-count ASIC designs. ASICs needing multiple supplies can also be supported. High-speed AC measurements are also possible without the use of expensive custom load-board systems.","PeriodicalId":164672,"journal":{"name":"Conference Record Southcon","volume":"123 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-03-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Universal at-speed test fixturing for high-pin-count ICs\",\"authors\":\"P. S. Levy\",\"doi\":\"10.1109/SOUTHC.1994.498152\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper details design guidelines and implementation of a universal load-board system to support high-pin-count ASIC designs. ASICs needing multiple supplies can also be supported. High-speed AC measurements are also possible without the use of expensive custom load-board systems.\",\"PeriodicalId\":164672,\"journal\":{\"name\":\"Conference Record Southcon\",\"volume\":\"123 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-03-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference Record Southcon\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SOUTHC.1994.498152\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Record Southcon","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SOUTHC.1994.498152","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Universal at-speed test fixturing for high-pin-count ICs
This paper details design guidelines and implementation of a universal load-board system to support high-pin-count ASIC designs. ASICs needing multiple supplies can also be supported. High-speed AC measurements are also possible without the use of expensive custom load-board systems.
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