Yield-aware平面布置图

Zhaojun Wo, I. Koren, M. Ciesielski
{"title":"Yield-aware平面布置图","authors":"Zhaojun Wo, I. Koren, M. Ciesielski","doi":"10.1109/DSD.2005.80","DOIUrl":null,"url":null,"abstract":"Yield is normally ignored during the floorplanning stage. Recently, it has been shown that floorplanning can affect the yield with the increased sizes of chips. With the \"medium-area clustering\" model, yield can be evaluated during the floorplanning stage. Therefore, it's straightforward to incorporate yield in modern floorplanners. However, conventional simulate-annealing (SA) based moves are only designed for the combination of the area and/or the wire length minimizations. In this paper, we proposed a heuristic scheme of \"moves\" directly targeting on the yield improvement. The experimental results show a great yield improvement with little penalty for the area and/or the total wire length.","PeriodicalId":119054,"journal":{"name":"8th Euromicro Conference on Digital System Design (DSD'05)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-08-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Yield-aware floorplanning\",\"authors\":\"Zhaojun Wo, I. Koren, M. Ciesielski\",\"doi\":\"10.1109/DSD.2005.80\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Yield is normally ignored during the floorplanning stage. Recently, it has been shown that floorplanning can affect the yield with the increased sizes of chips. With the \\\"medium-area clustering\\\" model, yield can be evaluated during the floorplanning stage. Therefore, it's straightforward to incorporate yield in modern floorplanners. However, conventional simulate-annealing (SA) based moves are only designed for the combination of the area and/or the wire length minimizations. In this paper, we proposed a heuristic scheme of \\\"moves\\\" directly targeting on the yield improvement. The experimental results show a great yield improvement with little penalty for the area and/or the total wire length.\",\"PeriodicalId\":119054,\"journal\":{\"name\":\"8th Euromicro Conference on Digital System Design (DSD'05)\",\"volume\":\"24 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-08-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"8th Euromicro Conference on Digital System Design (DSD'05)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DSD.2005.80\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"8th Euromicro Conference on Digital System Design (DSD'05)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DSD.2005.80","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

在平面规划阶段,产量通常被忽略。最近,有研究表明,随着芯片尺寸的增加,平面规划会影响良率。利用“中面积聚类”模型,可以在规划阶段对成品率进行评估。因此,在现代平面图中加入产量是很简单的。然而,传统的基于模拟退火(SA)的移动仅设计用于面积和/或导线长度最小化的组合。在本文中,我们提出了一种直接针对产量提高的启发式“移动”方案。实验结果表明,在面积和/或总导线长度几乎没有损失的情况下,成品率有很大的提高。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Yield-aware floorplanning
Yield is normally ignored during the floorplanning stage. Recently, it has been shown that floorplanning can affect the yield with the increased sizes of chips. With the "medium-area clustering" model, yield can be evaluated during the floorplanning stage. Therefore, it's straightforward to incorporate yield in modern floorplanners. However, conventional simulate-annealing (SA) based moves are only designed for the combination of the area and/or the wire length minimizations. In this paper, we proposed a heuristic scheme of "moves" directly targeting on the yield improvement. The experimental results show a great yield improvement with little penalty for the area and/or the total wire length.
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