欧姆型射频MEMS开关的热接触电阻评估

M. S. Gaikwad, N. Deshmukh, V. B. Sawant, Prof. (Dr) Suhas Sakharam Mohite
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引用次数: 1

摘要

了解和控制热接触电阻对于提高射频MEMS开关的性能至关重要,即低插入损耗,高隔离以及低功耗。本文介绍了用于评估热接触电阻的RF-MEMS开关的设计、建模和分析。热接触电阻取决于所使用的薄膜材料、接触力、粗糙度系数、占据空隙空间的材料和温度。在我们的分析中考虑了接触力来确定接触电阻。进一步采用一维热流模型来理解开关的动态特性。利用有限元分析软件ANSYS获得了膜的模态频率、应力。计算表明,该器件的总接触热阻为5.89 k/w。从HFSS软件中提取射频性能参数,结果表明,在25 GHz处插入损耗为0.17dB,在2 GHz处回波损耗优于37dB,在25 GHz处回波损耗优于16dB。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Evaluating Thermal Contact Resistance for Ohmic type RF MEMS switch
To understand and control the thermal contact resistance is critical for improving the performance of RF MEMS switch viz., low insertion loss, high isolation as well as low power consumption. This paper presents the design, modeling, and analysis of the RF-MEMS switch for evaluating thermal contact resistance. Thermal contact resistance depends on the thin film materials used, contact force, the roughness factor, material occupying the void spaces, and temperature. The contact force is considered in our analysis for determining the contact resistance. The further one-dimensional heat flow model is used to understand the dynamic behavior of the switch. Finite element analysis software ANSYS is used to obtain modal frequencies, stresses induced in the membrane. The calculations indicate that the total thermal contact resistance of the device is 5.89 k/w. The RF performance parameters are extracted from HFSS software which shows that insertion loss of 0.17dB up to 25 GHz, return loss better than 37dB at 2 GHz and 16dB up to 25 GHz is obtained.
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