垂直金刚石肖特基二极管的反向恢复行为

K. Woo, B. Shankar, M. Malakoutian, F. Koeck, R. Nemanich, S. Chowdhury
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引用次数: 0

摘要

金刚石作为一种超宽带隙材料,在电力电子领域是一种极具吸引力的半导体材料。为了减少显著的能量损失,应该研究用于电源应用的器件的开关行为。在这项研究中,我们研究了垂直菱形肖特基势垒二极管的开关行为。根据钳位电感开关测试装置的不同,测量到反向恢复时间平均为~4 - 7ns。二极管从高达948 a /cm2的导电电流切换到高达0.6 MV/cm的阻塞场。极短的反向恢复时间,加上对不同导通电流、开关频率和温度的响应变化最小,表明多数载流子金刚石器件如预期的那样。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Reverse Recovery Behavior in Vertical Diamond Schottky Diodes
As an ultra-wide-bandgap material, diamond is an extremely attractive semiconductor for power electronic applications. The switching behavior in devices for power applications should be investigated to reduce significant energy losses. In this study, we have investigated the switching behavior in a vertical diamond Schottky barrier diode. The reverse recovery time was measured to be ~4–7 ns on average depending on the clamped inductive switching test setup. The diode was switched from a conducting current of as much as 948 A/cm2 to a blocking field up to 0.6 MV/cm. Very short reverse recovery times in addition to minimal changes in response to differing levels of on-state current, switching frequency, and temperature indicate a majority carrier diamond device as expected.
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