{"title":"BSIM3 MOSFET模型精度的射频电路仿真","authors":"S. Tin, A. Osman, K. Mayaram, C. Hu","doi":"10.1109/RAWCON.1998.709209","DOIUrl":null,"url":null,"abstract":"The accuracy of the BSIM3 MOSFET model for small-signal RF circuit simulation has been investigated for a 0.5 /spl mu/m CMOS process. Comparisons of the small signal y and s parameters for different bias conditions and channel lengths show that BSIM3 is reasonably well suited for small-signal analyses from 100 kHz up to 10 GHz.","PeriodicalId":226788,"journal":{"name":"Proceedings RAWCON 98. 1998 IEEE Radio and Wireless Conference (Cat. No.98EX194)","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"BSIM3 MOSFET model accuracy for RF circuit simulation\",\"authors\":\"S. Tin, A. Osman, K. Mayaram, C. Hu\",\"doi\":\"10.1109/RAWCON.1998.709209\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The accuracy of the BSIM3 MOSFET model for small-signal RF circuit simulation has been investigated for a 0.5 /spl mu/m CMOS process. Comparisons of the small signal y and s parameters for different bias conditions and channel lengths show that BSIM3 is reasonably well suited for small-signal analyses from 100 kHz up to 10 GHz.\",\"PeriodicalId\":226788,\"journal\":{\"name\":\"Proceedings RAWCON 98. 1998 IEEE Radio and Wireless Conference (Cat. No.98EX194)\",\"volume\":\"45 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-08-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings RAWCON 98. 1998 IEEE Radio and Wireless Conference (Cat. No.98EX194)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RAWCON.1998.709209\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings RAWCON 98. 1998 IEEE Radio and Wireless Conference (Cat. No.98EX194)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RAWCON.1998.709209","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
BSIM3 MOSFET model accuracy for RF circuit simulation
The accuracy of the BSIM3 MOSFET model for small-signal RF circuit simulation has been investigated for a 0.5 /spl mu/m CMOS process. Comparisons of the small signal y and s parameters for different bias conditions and channel lengths show that BSIM3 is reasonably well suited for small-signal analyses from 100 kHz up to 10 GHz.