{"title":"100w Doherty功率放大器x参数测量的研究","authors":"J. Wood, G. Collins","doi":"10.1109/ARFTG.2010.5496319","DOIUrl":null,"url":null,"abstract":"In this article we describe a high-power reflectometer set-up specifically designed for large-signal nVNA measurements for the extraction of X-parameters. The heart of the measurement set-up is an Agilent N5242A PNA-X in nVNA mode. We have measured a Doherty amplifier constructed from a 2-stage, dual-path RF power amplifier IC. This power amplifier can deliver in excess of 100 W in Doherty mode, and these measurements represent the highest power X-parameter extraction reported to date.","PeriodicalId":221794,"journal":{"name":"75th ARFTG Microwave Measurement Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"17","resultStr":"{\"title\":\"Investigation of X-parameters measurements on a 100 W Doherty power amplifier\",\"authors\":\"J. Wood, G. Collins\",\"doi\":\"10.1109/ARFTG.2010.5496319\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this article we describe a high-power reflectometer set-up specifically designed for large-signal nVNA measurements for the extraction of X-parameters. The heart of the measurement set-up is an Agilent N5242A PNA-X in nVNA mode. We have measured a Doherty amplifier constructed from a 2-stage, dual-path RF power amplifier IC. This power amplifier can deliver in excess of 100 W in Doherty mode, and these measurements represent the highest power X-parameter extraction reported to date.\",\"PeriodicalId\":221794,\"journal\":{\"name\":\"75th ARFTG Microwave Measurement Conference\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-05-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"17\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"75th ARFTG Microwave Measurement Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2010.5496319\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"75th ARFTG Microwave Measurement Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2010.5496319","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Investigation of X-parameters measurements on a 100 W Doherty power amplifier
In this article we describe a high-power reflectometer set-up specifically designed for large-signal nVNA measurements for the extraction of X-parameters. The heart of the measurement set-up is an Agilent N5242A PNA-X in nVNA mode. We have measured a Doherty amplifier constructed from a 2-stage, dual-path RF power amplifier IC. This power amplifier can deliver in excess of 100 W in Doherty mode, and these measurements represent the highest power X-parameter extraction reported to date.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
