{"title":"闭环系统的故障安全设计","authors":"Alvis J. Somerville","doi":"10.1109/ECBS.1988.5440","DOIUrl":null,"url":null,"abstract":"A general approach for designing closed-loop systems that will be safe in the presence of hardware failures in medical instruments is presented. Specific recommendations to attain a fail-safe system are made (i.e. hardware and software features). Special attention is paid to checking the read-only and random-access memories.<<ETX>>","PeriodicalId":291071,"journal":{"name":"Proceedings of the Symposium on the Engineering of Computer-Based Medical","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Failsafe design of closed loop systems\",\"authors\":\"Alvis J. Somerville\",\"doi\":\"10.1109/ECBS.1988.5440\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A general approach for designing closed-loop systems that will be safe in the presence of hardware failures in medical instruments is presented. Specific recommendations to attain a fail-safe system are made (i.e. hardware and software features). Special attention is paid to checking the read-only and random-access memories.<<ETX>>\",\"PeriodicalId\":291071,\"journal\":{\"name\":\"Proceedings of the Symposium on the Engineering of Computer-Based Medical\",\"volume\":\"43 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-06-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the Symposium on the Engineering of Computer-Based Medical\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECBS.1988.5440\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Symposium on the Engineering of Computer-Based Medical","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECBS.1988.5440","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A general approach for designing closed-loop systems that will be safe in the presence of hardware failures in medical instruments is presented. Specific recommendations to attain a fail-safe system are made (i.e. hardware and software features). Special attention is paid to checking the read-only and random-access memories.<>
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