一个带有测试工作的离散软件可靠性增长模型

Proceedings of 1994 1st International Conference on Software Testing, Reliability and Quality Assurance (STRQA'94) Pub Date : 1994-12-21 DOI:10.1109/STRQA.1994.526379

P. K. Kapur, M. Xie, R. Garg, Abhishek Kumar Jha

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引用次数: 30

摘要

我们提出了一个带有测试工作量的离散软件可靠性增长模型。测试工作的行为用一条离散的瑞利曲线来描述。假设当前测试工作量的离散失效强度与剩余误差内容成正比，我们将模型表示为非齐次泊松过程。对模型参数进行了估计。然后我们讨论基于成本和故障强度标准的发布策略。并给出了数值结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A discrete software reliability growth model with testing effort

We propose a discrete software reliability growth model with testing effort. The behaviour of the testing effort is described by a discrete Rayleigh curve. Assuming that the discrete failure intensity to the amount of current testing effort is proportional to the remaining error content, we formulate the model as a non-homogeneous poisson process. Parameters of the model are estimated. We then discuss a release policy based on cost and failure intensity criteria. Numerical results are also presented.

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Proceedings of 1994 1st International Conference on Software Testing, Reliability and Quality Assurance (STRQA'94)

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