微处理器辐射诱导效应简编

2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2019-09-01 DOI:10.1109/radecs47380.2019.9745694

G. Tsiligiannis, S. Danzeca, A. Masi

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引用次数: 0

摘要

本文分析了四种基于arm的微处理器在质子诱导辐射下的灵敏度。本研究旨在探讨这些装置在CERN辐射环境下的可靠性限制。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Compendium of Radiation-Induced Effects on µProcessors

In this paper, we analyze the sensitivity of four ARM-based microprocessors under Proton induced radiation. The purpose of the study is to explore the reliability limitations of these devices under the CERN radiation environment.

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来源期刊

2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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