Secondary ion mass spectrometry study of organic and inorganic interfaces in methylammonium lead triiodide solar cells

The study of unstable interfaces in perovskite semiconductors requires crucial information on interfacial composition, chemical gradients, and impurity distribution. A versatile technique called TOF-SIMS can provide this information effectively. Solar cells employing methylammonium lead triiodide as the photoactive layer were fabricated, utilizing PEDOT:PSS or NiOx thin film as the hole transporting layer, and PCBM plus ZnO as the electron transporting layer. These inorganic and organic layers were deposited through magnetron sputtering and solution processing, respectively. To comprehensively examine each interface within the device structure, a detailed TOF-SIMS study was conducted.