{"title":"超快电脉冲在金属带材上传播的瞬时图像观测","authors":"K. Takeuchi, A. Mizuhara","doi":"10.1109/MWP.1996.660358","DOIUrl":null,"url":null,"abstract":"Instantaneous potential distribution of 2 ps propagating pulse was visualized using a scanning force optoelectronic microscope. A special probe made of low temperature grown GaAs is the key in the optical sampling measurement.","PeriodicalId":433743,"journal":{"name":"International Topical Meeting on Microwave Photonics. MWP '96 Technical Digest. Satellite Workshop (Cat. No.96TH8153)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Instantaneous image observation of ultrafast electrical pulse propagating on metal strip\",\"authors\":\"K. Takeuchi, A. Mizuhara\",\"doi\":\"10.1109/MWP.1996.660358\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Instantaneous potential distribution of 2 ps propagating pulse was visualized using a scanning force optoelectronic microscope. A special probe made of low temperature grown GaAs is the key in the optical sampling measurement.\",\"PeriodicalId\":433743,\"journal\":{\"name\":\"International Topical Meeting on Microwave Photonics. MWP '96 Technical Digest. Satellite Workshop (Cat. No.96TH8153)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-12-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Topical Meeting on Microwave Photonics. MWP '96 Technical Digest. Satellite Workshop (Cat. No.96TH8153)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWP.1996.660358\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Topical Meeting on Microwave Photonics. MWP '96 Technical Digest. Satellite Workshop (Cat. No.96TH8153)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWP.1996.660358","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Instantaneous image observation of ultrafast electrical pulse propagating on metal strip
Instantaneous potential distribution of 2 ps propagating pulse was visualized using a scanning force optoelectronic microscope. A special probe made of low temperature grown GaAs is the key in the optical sampling measurement.