用于极端规模系统的EDA:设计抽象、度量和基准

A. Jones
{"title":"用于极端规模系统的EDA:设计抽象、度量和基准","authors":"A. Jones","doi":"10.1145/2591513.2597170","DOIUrl":null,"url":null,"abstract":"The context for EDA research is rapidly changing thanks to enhanced and novel switching devices, manufacturing technologies, new application targets, and the increasing soft- ware development effort required for new ICs. These trends continue to expand the gap between the capabilities of systems and what can be utilized by designers. To address these problems requires a collaborative effort with indus- try researchers, academics, and funding agencies working together in close partnership. This talk describes recommendations from the recent CCC workshop series on EDA in the Extreme Scale era for improving the collaboration between IC designers and EDA. There remains a continued importance of effective design abstractions that facilitate research on EDA advances that can be effectively translated to actual design flows for relevant technologies. Further, these abstractions must be accompanied by (i) effective design metrics, especially for new technologies where optimization objectives may not be obvious, and (ii) appropriate benchmarks, especially for more established technologies where alternative optimization techniques must be carefully compared. Focus on these research directions for EDA will have direct impact to reduce the existing capabilities gap between tools and designers.","PeriodicalId":272619,"journal":{"name":"ACM Great Lakes Symposium on VLSI","volume":"63 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"EDA for extreme scale systems: design abstractions, metrics, and benchmarks\",\"authors\":\"A. Jones\",\"doi\":\"10.1145/2591513.2597170\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The context for EDA research is rapidly changing thanks to enhanced and novel switching devices, manufacturing technologies, new application targets, and the increasing soft- ware development effort required for new ICs. These trends continue to expand the gap between the capabilities of systems and what can be utilized by designers. To address these problems requires a collaborative effort with indus- try researchers, academics, and funding agencies working together in close partnership. This talk describes recommendations from the recent CCC workshop series on EDA in the Extreme Scale era for improving the collaboration between IC designers and EDA. There remains a continued importance of effective design abstractions that facilitate research on EDA advances that can be effectively translated to actual design flows for relevant technologies. Further, these abstractions must be accompanied by (i) effective design metrics, especially for new technologies where optimization objectives may not be obvious, and (ii) appropriate benchmarks, especially for more established technologies where alternative optimization techniques must be carefully compared. Focus on these research directions for EDA will have direct impact to reduce the existing capabilities gap between tools and designers.\",\"PeriodicalId\":272619,\"journal\":{\"name\":\"ACM Great Lakes Symposium on VLSI\",\"volume\":\"63 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-05-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ACM Great Lakes Symposium on VLSI\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/2591513.2597170\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACM Great Lakes Symposium on VLSI","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2591513.2597170","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

由于新型开关器件、制造技术、新的应用目标以及新型集成电路所需的软件开发工作不断增加,EDA研究的背景正在迅速变化。这些趋势继续扩大系统功能与设计人员可以利用的功能之间的差距。要解决这些问题,需要与工业研究人员、学者和资助机构密切合作,共同努力。本演讲介绍了最近的CCC系列研讨会关于在极端规模时代的EDA的建议,以改善IC设计师和EDA之间的协作。有效的设计抽象仍然具有持续的重要性,它促进了对EDA进展的研究,可以有效地转化为相关技术的实际设计流程。此外,这些抽象必须伴随着(i)有效的设计度量,特别是对于优化目标可能不明显的新技术,以及(ii)适当的基准,特别是对于必须仔细比较替代优化技术的更成熟的技术。关注这些研究方向对EDA将有直接的影响,以减少现有的工具和设计人员之间的能力差距。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
EDA for extreme scale systems: design abstractions, metrics, and benchmarks
The context for EDA research is rapidly changing thanks to enhanced and novel switching devices, manufacturing technologies, new application targets, and the increasing soft- ware development effort required for new ICs. These trends continue to expand the gap between the capabilities of systems and what can be utilized by designers. To address these problems requires a collaborative effort with indus- try researchers, academics, and funding agencies working together in close partnership. This talk describes recommendations from the recent CCC workshop series on EDA in the Extreme Scale era for improving the collaboration between IC designers and EDA. There remains a continued importance of effective design abstractions that facilitate research on EDA advances that can be effectively translated to actual design flows for relevant technologies. Further, these abstractions must be accompanied by (i) effective design metrics, especially for new technologies where optimization objectives may not be obvious, and (ii) appropriate benchmarks, especially for more established technologies where alternative optimization techniques must be carefully compared. Focus on these research directions for EDA will have direct impact to reduce the existing capabilities gap between tools and designers.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信