低成本的IDDQ测试解决方案

Digest of Papers 1996 IEEE International Workshop on IDDQ Testing Pub Date : 1996-10-24 DOI:10.1109/IDDQ.1996.557813

B. Thomas, R. Andlauer

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引用次数: 3

摘要

本文介绍了一种中速、可靠、经济的IDDQ测试方法。这种方法利用了典型的自动测试设备(ATE)系统上可用的标准资源，这些系统没有专门的IDDQ测量硬件。这是一种实用的解决方案，可以以低成本和最少的资源实现。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Low cost test solution for IDDQ

This paper describes a medium-speed, reliable and cost effective method of doing IDDQ testing. This method utilizes standard resources available on typical automatic test equipment (ATE) systems which do not have specialized IDDQ measurement hardware. This is a practical solution that can be implemented at a low cost and minimal resources.

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来源期刊

Digest of Papers 1996 IEEE International Workshop on IDDQ Testing

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