{"title":"电磁干扰的统计方法——理论与实验第一部分","authors":"D. Weiner, G. Capraro","doi":"10.1109/isemc.1987.7570812","DOIUrl":null,"url":null,"abstract":"A probabilistic approach to EMI is presented. The approach is illustrated by analyzing an experimental circuit in which EMI occurs. Both random and weakly nonlinear effects are accounted for in the analysis.","PeriodicalId":443616,"journal":{"name":"1987 IEEE International Symposium on Electromagnetic Compatibility","volume":"48 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"A Statistical Approach to EMI - Theory and Experiment Part I\",\"authors\":\"D. Weiner, G. Capraro\",\"doi\":\"10.1109/isemc.1987.7570812\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A probabilistic approach to EMI is presented. The approach is illustrated by analyzing an experimental circuit in which EMI occurs. Both random and weakly nonlinear effects are accounted for in the analysis.\",\"PeriodicalId\":443616,\"journal\":{\"name\":\"1987 IEEE International Symposium on Electromagnetic Compatibility\",\"volume\":\"48 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1987 IEEE International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/isemc.1987.7570812\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1987 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/isemc.1987.7570812","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Statistical Approach to EMI - Theory and Experiment Part I
A probabilistic approach to EMI is presented. The approach is illustrated by analyzing an experimental circuit in which EMI occurs. Both random and weakly nonlinear effects are accounted for in the analysis.