静电放电(ESD)和失效分析:模型、方法和机制

Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614) Pub Date : 2002-11-07 DOI:10.1109/IPFA.2002.1025612

S. Voldman

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引用次数: 8

摘要

失效分析是静电放电(ESD)器件和ESD稳健电路设计和开发方法的基础。本文讨论了失效分析在提高半导体产品和磁记录磁头ESD稳健性的模型、方法和机制评估中的作用。

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Electrostatic discharge (ESD) and failure analysis: models, methodologies and mechanisms

Failure analysis is fundamental to the design and development methodology of electrostatic discharge (ESD) devices and ESD robust circuits. The role of failure analysis in the models, methodology, and mechanisms evaluation for improving ESD robustness of semiconductor products and magnetic recording heads are discussed.

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Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614)

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