{"title":"基于IEEE 1149.1的芯片电压表/示波器","authors":"L. Whetsel","doi":"10.1109/VTEST.1993.313310","DOIUrl":null,"url":null,"abstract":"The concepts of a proposed IEEE 1149.1 based analog test device have been developed. This device can operate on the 1149.1 serial test bus to monitor and store analog signal data in much the same way as traditional analog test instruments. The primary advantage of this device is that it can be included on miniaturized printed circuit boards and within multi-chip modules to provide an embedded method of accessing and testing analog circuitry. This paper describes the proposed device and illustrates how it can be used in a system to monitor both static and dynamic analog signal types.<<ETX>>","PeriodicalId":283218,"journal":{"name":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"An IEEE 1149.1 based voltmeter/oscilloscope in a chip\",\"authors\":\"L. Whetsel\",\"doi\":\"10.1109/VTEST.1993.313310\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The concepts of a proposed IEEE 1149.1 based analog test device have been developed. This device can operate on the 1149.1 serial test bus to monitor and store analog signal data in much the same way as traditional analog test instruments. The primary advantage of this device is that it can be included on miniaturized printed circuit boards and within multi-chip modules to provide an embedded method of accessing and testing analog circuitry. This paper describes the proposed device and illustrates how it can be used in a system to monitor both static and dynamic analog signal types.<<ETX>>\",\"PeriodicalId\":283218,\"journal\":{\"name\":\"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-04-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTEST.1993.313310\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1993.313310","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An IEEE 1149.1 based voltmeter/oscilloscope in a chip
The concepts of a proposed IEEE 1149.1 based analog test device have been developed. This device can operate on the 1149.1 serial test bus to monitor and store analog signal data in much the same way as traditional analog test instruments. The primary advantage of this device is that it can be included on miniaturized printed circuit boards and within multi-chip modules to provide an embedded method of accessing and testing analog circuitry. This paper describes the proposed device and illustrates how it can be used in a system to monitor both static and dynamic analog signal types.<>
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