高强度紫外线照射下光学薄膜老化效应的研究

F. Su, H. Tsai, Y. Hsieh, Chih-Chung Yang, Min-Wei Hung
{"title":"高强度紫外线照射下光学薄膜老化效应的研究","authors":"F. Su, H. Tsai, Y. Hsieh, Chih-Chung Yang, Min-Wei Hung","doi":"10.5220/0007377201740180","DOIUrl":null,"url":null,"abstract":"In the semiconductor industry, for lithography system the reflective film coated on the mirror and the antireflective film coated on the correction lens in the projection lens module were usually irradiated by the high intensity of I-line light, and the optical film will gradually age and become matte after using a period of time. In order to investigate the ingredient variation and aging effects of the optical film caused by i-line light, a UV light irradiation environment was built with an optical power of 80 mW. In the experiment, the reflective and anti-reflective film was coated on the BK-7 glass and irradiated by 24 to 120 hours. Then, the reflectivity/transmittance and the ingredient of optical film was measured and analyzed. The reflectivity and transmittance of optical film varied after 24 hour irradiation and decreased approximately 1.67 and 0.9 wt% after 120 hours irradiation, respectively. In addition, the results obtained from the focused ion beam (FIB) system indicated that the ingredient of oxygen of both films increased and the anti-reflective film ruptured evidently under 120 hours of irradiation. The results from the manuscript can serve as reference information for durability evaluation of optical film employed in the projection lens module in the semiconductor","PeriodicalId":294758,"journal":{"name":"International Conference on Photonics, Optics and Laser Technology","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Study on Aging Effect of Optical Film under High Intensity of UV Exposure\",\"authors\":\"F. Su, H. Tsai, Y. Hsieh, Chih-Chung Yang, Min-Wei Hung\",\"doi\":\"10.5220/0007377201740180\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In the semiconductor industry, for lithography system the reflective film coated on the mirror and the antireflective film coated on the correction lens in the projection lens module were usually irradiated by the high intensity of I-line light, and the optical film will gradually age and become matte after using a period of time. In order to investigate the ingredient variation and aging effects of the optical film caused by i-line light, a UV light irradiation environment was built with an optical power of 80 mW. In the experiment, the reflective and anti-reflective film was coated on the BK-7 glass and irradiated by 24 to 120 hours. Then, the reflectivity/transmittance and the ingredient of optical film was measured and analyzed. The reflectivity and transmittance of optical film varied after 24 hour irradiation and decreased approximately 1.67 and 0.9 wt% after 120 hours irradiation, respectively. In addition, the results obtained from the focused ion beam (FIB) system indicated that the ingredient of oxygen of both films increased and the anti-reflective film ruptured evidently under 120 hours of irradiation. The results from the manuscript can serve as reference information for durability evaluation of optical film employed in the projection lens module in the semiconductor\",\"PeriodicalId\":294758,\"journal\":{\"name\":\"International Conference on Photonics, Optics and Laser Technology\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Conference on Photonics, Optics and Laser Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.5220/0007377201740180\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Conference on Photonics, Optics and Laser Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.5220/0007377201740180","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

在半导体工业中,对于光刻系统,投影透镜模块中反射镜上涂覆的反射膜和校正镜上涂覆的减反射膜通常受到高强度i线光的照射,光学膜在使用一段时间后会逐渐老化,变得哑光。为了研究i线光对光学薄膜成分变化及老化的影响,建立了光功率为80 mW的紫外光辐照环境。实验中,在BK-7玻璃上涂覆反射和增透膜,辐照24 ~ 120小时。然后,测量和分析了光学薄膜的反射率/透射率和成分。光膜的反射率和透光率在辐照24 h后发生变化,辐照120 h后分别下降约1.67%和0.9 wt%。此外,聚焦离子束(FIB)系统的结果表明,在120小时的辐照下,两种膜的氧成分都增加了,增透膜明显破裂。本文的研究结果可作为半导体投影透镜模组所用光学薄膜耐久性评估的参考信息
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Study on Aging Effect of Optical Film under High Intensity of UV Exposure
In the semiconductor industry, for lithography system the reflective film coated on the mirror and the antireflective film coated on the correction lens in the projection lens module were usually irradiated by the high intensity of I-line light, and the optical film will gradually age and become matte after using a period of time. In order to investigate the ingredient variation and aging effects of the optical film caused by i-line light, a UV light irradiation environment was built with an optical power of 80 mW. In the experiment, the reflective and anti-reflective film was coated on the BK-7 glass and irradiated by 24 to 120 hours. Then, the reflectivity/transmittance and the ingredient of optical film was measured and analyzed. The reflectivity and transmittance of optical film varied after 24 hour irradiation and decreased approximately 1.67 and 0.9 wt% after 120 hours irradiation, respectively. In addition, the results obtained from the focused ion beam (FIB) system indicated that the ingredient of oxygen of both films increased and the anti-reflective film ruptured evidently under 120 hours of irradiation. The results from the manuscript can serve as reference information for durability evaluation of optical film employed in the projection lens module in the semiconductor
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信