Automatic Seed Generation for Weighted Test Pattern Generation

A pseudorandom test pattern is generated by a test pattern generator, where a pseudo-random pattern is probably weighted to increase fault coverage in a built-in self-test. Reduced power consumption and area can enable a scan chain for the efficient weighted pattern. The weighted patterns are used for all scan chains to build a self-test architecture. It improves the fault coverage and removes the fault at a specified output. To achieve this, a built-in self-test requirement should be focused on the highest fault coverage. The initial seed flipping is a technique used to analyze the test coverage and test time. The proposed weighted test pattern generator simulation outputs are obtained by using Xilinx IC design with 14.7 version IC design software.