{"title":"动态力显微镜的非线性分析","authors":"Jingbo Jiang, H. Marquez","doi":"10.1109/ACC.2006.1655409","DOIUrl":null,"url":null,"abstract":"Dynamic force microscopy is a powerful tool to image non-conductive materials with atomic resolution using the nonlinear interaction force. A perturbation method is extended to analyze the nonlinear oscillation dynamics of the frequency modulation dynamic force microscopy. A general resonant frequency shift formula is derived for both conservative and dissipative interaction forces, and validation conditions are provided. Furthermore, the approximate motions of higher resonances are derived, which provide in depth analysis of force-motion relation, and can be applied for force sensing when amplitudes of higher resonances are measurable","PeriodicalId":265903,"journal":{"name":"2006 American Control Conference","volume":"64 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-06-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Nonlinear analysis of dynamic force microscopy\",\"authors\":\"Jingbo Jiang, H. Marquez\",\"doi\":\"10.1109/ACC.2006.1655409\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Dynamic force microscopy is a powerful tool to image non-conductive materials with atomic resolution using the nonlinear interaction force. A perturbation method is extended to analyze the nonlinear oscillation dynamics of the frequency modulation dynamic force microscopy. A general resonant frequency shift formula is derived for both conservative and dissipative interaction forces, and validation conditions are provided. Furthermore, the approximate motions of higher resonances are derived, which provide in depth analysis of force-motion relation, and can be applied for force sensing when amplitudes of higher resonances are measurable\",\"PeriodicalId\":265903,\"journal\":{\"name\":\"2006 American Control Conference\",\"volume\":\"64 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-06-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 American Control Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ACC.2006.1655409\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 American Control Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ACC.2006.1655409","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Dynamic force microscopy is a powerful tool to image non-conductive materials with atomic resolution using the nonlinear interaction force. A perturbation method is extended to analyze the nonlinear oscillation dynamics of the frequency modulation dynamic force microscopy. A general resonant frequency shift formula is derived for both conservative and dissipative interaction forces, and validation conditions are provided. Furthermore, the approximate motions of higher resonances are derived, which provide in depth analysis of force-motion relation, and can be applied for force sensing when amplitudes of higher resonances are measurable
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